ABANDONED - NO STATEMENT OF USE FILED
no statement of use filed
on 09 Jan 2004
Last Applicant/ Owned by
1550 Buckeye Drive
Milpitas
CA
95035
Serial Number
76442279 filed on 20th Aug 2002
Registration Number
N/A
Filing Basis
1. intent to use
2. intent to use current
Disclaimer
NO DATA
NANOUDI
Metrology system for the detection and measurement of particles and defects comprised principally of low distortion optics, a high intensity broadband light source, high resolution detector, and image processing and defect detection software, that enables inspection of both the front and backside of a sample, particularly, a semiconductor wafer, mask, flat panel display, or magnetic substrate
Classification Information
Class [009]
Computer & Software Products & Electrical & Scientific Products
Metrology system for the detection and measurement of particles and defects comprised principally of low distortion optics, a high intensity broadband light source, high resolution detector, and image processing and defect detection software, that enables inspection of both the front and backside of a sample, particularly, a semiconductor wafer, mask, flat panel display, or magnetic substrate
Mark Details
Serial Number
No 76442279
Mark Type
No Service/Collective Mark
Attorney Docket Number
No
44D Filed
No
44D Current
No
44E filed
No
44E Current
No
66A Filed
No
66A Current
No
Current Basis
No
No Basis
No
Legal History
| Status Date | Action Taken |
|---|---|
| 28th May 2004 | ABANDONMENT - NO USE STATEMENT FILED |
| 21st May 2004 | CASE FILE IN TICRS |
| 08th Jul 2003 | NOA MAILED - SOU REQUIRED FROM APPLICANT |
| 15th Apr 2003 | PUBLISHED FOR OPPOSITION |
| 26th Mar 2003 | NOTICE OF PUBLICATION |
| 19th Feb 2003 | PAPER RECEIVED |
| 13th Feb 2003 | APPROVED FOR PUB - PRINCIPAL REGISTER |
| 13th Feb 2003 | EXAMINERS AMENDMENT E-MAILED |
| 27th Jan 2003 | CORRESPONDENCE RECEIVED IN LAW OFFICE |
| 27th Jan 2003 | PAPER RECEIVED |