About 38 Trademarks found that are owned by Nanometrics Incorporated

Z BEAM

Computer software for use in inspecting semiconductor wafers, substrates and lithographic masks including analysis of substrate and surface topography and defects

"CALIPER"

ELECTRONIC INSPECTION APPARATUS FOR SEMICONDUCTORS

Metrology products, namely, optical instruments, namely, ellipsometers, reflectometers, interferometers, scatterometers, comparitors, darkfield imagers, brightfield imagers, aerial imagers, diffraction imagers and photoluminescent imagers for optimizing manufacturing processes through the science of measurement

Optical inspection system for semiconductor wafers in various stages of processing, said system comprised of imaging cameras, optical filters, control computer, and monochromatic illumination source comprised of laser and LED light sensors, the foregoing used to illuminate semiconductor wafers by ultra violet, infra-red and visible light, and thereby to acquire a spatial or spatial/spectral image of the band-edge luminescence emitted by the wafer using an imaging camera

OPTICAL METROLOGY INSTRUMENT USED TO MEASURE MICROSCOPIC FEATURES OF SAMPLES, PARTICULARLY, OF SEMICONDUCTOR WAFERS, FLAT PANEL DISPLAYS AND MAGNETIC MEDIA

Optical inspection system for semiconductor wafers in various stages of processing, said system comprised of imaging cameras, optical filters, control computer, and monochromatic illumination source comprised of laser and LED light sensors, the foregoing used to illuminate semiconductor wafers by ultra violet, infra-red and visible light, and thereby to acquire a spatial or spatial/spectral image of the band-edge luminescence emitted by the wafer using an imaging camera

Optical inspection apparatus for inspection and measurement of semiconductor wafers and similar substrates in various stages of processing comprised of a control computer, software, automatic recipe controlled sample handling, monochromatic illumination sources, light sensors, cameras, optical filters, and monochrometers and spectrometers

NANO LYNX; NANOMETRICS LYNX