no statement of use filed
on 29 Jun 2000
Last Applicant/ Owned by
310 DeGuigne Drive
Sunnyvale
CA
94086
Serial Number
75593732 filed on 23rd Nov 1998
Registration Number
N/A
Filing Basis
1. intent to use
2. intent to use current
Disclaimer
NO DATA
A metrology tool for measuring the thickness, and analyzing the composition of certain films such as, but not limited to, polycrystalline films deposited on substrates including, but not limited to, semiconductor wafers, flat panel display substrates and magnetic head substrates, such film properties are determined by various methods such as, but not limited to, reflectometry, ellipsometry and int Read More
A metrology tool for measuring the thickness, and analyzing the composition of certain films such as, but not limited to, polycrystalline films deposited on substrates including, but not limited to, semiconductor wafers, flat panel display substrates and magnetic head substrates, such film properties are determined by various methods such as, but not limited to, reflectometry, ellipsometry and interferometry
No 75593732
No Service/Collective Mark
No
No
No
No
No
No
No
No
No
Status Date | Action Taken |
---|---|
29th Aug 2000 | ABANDONMENT - NO USE STATEMENT FILED |
28th Dec 1999 | NOA MAILED - SOU REQUIRED FROM APPLICANT |
05th Oct 1999 | PUBLISHED FOR OPPOSITION |
03rd Sep 1999 | NOTICE OF PUBLICATION |
26th May 1999 | APPROVED FOR PUB - PRINCIPAL REGISTER |
19th May 1999 | ASSIGNED TO EXAMINER |