About 76 Trademarks found that are owned by Onto Innovation Inc.

Automated system comprising a broad band spectroscopic ellipsometer and reflectometer for use in measuring thin film thickness of dielectric coatings and critical dimensions in the production and fabrication of microscopic and nano-scale devices

Inspection and metrology equipment and devices, namely, instruments and devices that sense and/or capture images of semiconductor and electronic related components, primarily semiconductor wafers, semiconductor die, packaged integrated circuits, printed circuit boards, liquid crystal displays, electronic displays, and disk storage media, and automatically inspect these images for information such as defects, coordinate or position determination, identification, and/or presence or absence of a feature, characteristic or substance thereon

Inspection equipment and devices, namely, equipment and devices that sense and/or capture images of semiconductor and related electronic components including semiconductor wafers, semiconductor die, packaged integrated circuits, printed circuit boards, liquid crystal displays, electronic displays, and disk storage media, and automatically inspect these images for information about structural anomalies, and/or presence or absence of structural anomalies thereon

HARDWARE AND SOFTWARE SYSTEMS COMPRISING COMPUTERS, COMPUTER SOFTWARE, ELECTRONIC HARDWARE AND MECHANICAL HARDWARE FOR MICROPOSITIONING CONTROL, NAMELY, THE DESIGN, MANUFACTURE AND APPLICATION OF MICROPOSITIONING CONTROL IN PRECISION ACTUATORS, CONTROL SYSTEMS FOR PHOTONICS, DIGITAL FLOW CONTROL, SEMICONDUCTOR TEST AND INSPECTION [, AND BIOMEDICAL MICROSCOPY AND SCANNING SYSTEMS ]

Optical metrology, characterization, and inspection systems comprised of machine, components and operating software therefor sold as a unit for use in the testing of transmitted wavefront and surface shape of optical components, surface roughness of optics, metals, semiconductors, ceramics, plastics, paints and other finely finished materials, and defects and geometries of parts in aerospace, automotive, power generation, semiconductor, data storage, bearings, additive manufacturing and other precision-machined components; interferometers for use in the testing of transmitted wavefront and surface shape of optical components, surface roughness of optics, metals, semiconductors, ceramics, plastics, paints and other finely finished materials, and defects and geometries of parts in aerospace, automotive, power generation, semiconductor, data storage, bearings, additive manufacturing and other precision-machined components; downloadable software, namely, process control and defect analysis software for use in the production of laminar substrates including discrete electronic components, semiconductors including non-volatile and volatile memory devices, foundry and logic devices, asic devices, cmos image sensors, microelectromechanical systems, light emitting diodes, and other micro and nano technology devices, system in package, heterogeneous packaging, and other advanced packaging electronics technologies; downloadable software for the semiconductor industry, namely, downloadable software for identifying defects in semiconductor structures, downloadable software for identifying semiconductor fabrication process excursions, downloadable software for recording and reviewing defects in semiconductors structures, downloadable software for identifying root causes of defects in semiconductor structures, and downloadable software for controlling and monitoring semiconductor fabrication equipment; metrology inspection equipment for use in the manufacturing, inspection, testing and repair of semiconductor substrates; metrology inspection equipment and devices, namely, instruments and devices that sense and capture images of semiconductor components, semiconductor wafers, semiconductor die, packaged integrated circuits, printed circuit boards, liquid crystal displays, electronic displays, and disk storage media, and inspect these images for defects, coordinate or position determination, identification, or presence or absence of a feature, characteristic or substance thereon; metrology inspection systems comprised of one or more light sources, one or more cameras and/or sensors in communication with embedded computer software and hardware used for the measurement of thickness, adhesion properties, and structural properties of semiconductor materials and for monitoring the performance of semiconductor fabrication processes; optical inspection equipment for 2D and 3D inspection of semiconductor materials; metrology instruments for metrology purposes, namely, apparatus for measuring physical dimensions of samples and thicknesses of deposited films or for analyzing chemical composition of materials, consisting of optical microscope, electron microscope, spectrophotometer, ellipsometer and scanning slit densitometers

Lithography machines for the manufacture of microelectronics, integrated circuits, light emitting diodes, and semiconductors on laminar substrates including wafers, glass panels, and packaging panels such as copper plate or plastic; Optical metrology, characterization, and inspection systems comprised of a machine, components and operating software therefor sold as a unit for use in the production of laminar substrates including discrete electronic components, semiconductors including non-volatile and volatile memory devices, foundry and logic devices, asic devices, cmos image sensors, microelectromechanical systems, light emitting diodes, and other micro and nano technology devices, system in package, heterogeneous packaging, and other advanced packaging electronics technologies; optical metrology, characterization, and inspection systems comprised of machine, components and operating software therefor sold as a unit for use in the production of precision machined optical surfaces, optical coatings, and optical assemblies including reference flat, sphere, asphere and assemblies composed of both refractive and reflective components

metrology instrument utilizing an optical technique for measuring microscopic features on samples, namely, semiconductor wafers, flat panel displays and magnetic media

Machines for manufacturing semiconductors

downloadable software for use in analyzing manufacturing data, making predictions based on manufacturing data, analyzing supply chains, and process control, all in the field of manufacturing

Providing on-line non-downloadable modeling, visualization and analysis software for use in analyzing physical structures on semiconductor wafers and other substrates with nanoscale features; providing on-line non-downloadable modeling, visualization and analysis software via a global computer network for use in analyzing physical structures on semiconductor wafers and other substrates with nano-scale features

Recorded computer software for use in the operation, control and calibration of metrology inspection equipment used in the manufacturing, inspection, testing and repair of semiconductor substrates, and for reporting measurement and inspection analysis data and results of said metrology inspection equipment