REGISTERED
on 09 Jul 2024
Last Applicant/ Owned by
16 Jonspin Road
Wilmington
MA
01887
Serial Number
97308047 filed on 11th Mar 2022
Registration Number
7444130 registered on 09th Jul 2024
Correspondent Address
Heather J. Kliebenstein
Filing Basis
1. intent to use
2. use application currently
Disclaimer
NO DATA
NANOMETRICS
Providing temporary use on online, non-downloadable process control and defect analysis software for use in the production of laminar substrates including discrete electronic components, semiconductors including non-volatile and volatile memory devices, foundry and logic devices, asic devices, cmos image sensors, microelectromechanical systems, light emitting diodes, and other micro and nano techn Read More
Classification Information
Class [042]
Computer & Software Services & Scientific Services
Providing temporary use on online, non-downloadable process control and defect analysis software for use in the production of laminar substrates including discrete electronic components, semiconductors including non-volatile and volatile memory devices, foundry and logic devices, asic devices, cmos image sensors, microelectromechanical systems, light emitting diodes, and other micro and nano technology devices, system in package, heterogenous packaging, and other advanced packaging electronics technologies; providing online non-downloadable software for the semiconductor industry, namely, online non-downloadable software for identifying defects in semiconductor structures, online non-downloadable software for identifying semiconductor fabrication process excursions, online non-downloadable software for recording and reviewing defects in semiconductors structures, online non-downloadable software for identifying root causes of defects in semiconductor structures, and online non-downloadable software for controlling and monitoring semiconductor fabrication equipment
First Use Date in General
29th Mar 2024
First Use Date in Commerce
29th Mar 2024
Class [009]
Computer & Software Products & Electrical & Scientific Products
Optical metrology, characterization, and inspection systems comprised of machine, components and operating software therefor sold as a unit for use in the testing of transmitted wavefront and surface shape of optical components, surface roughness of optics, metals, semiconductors, ceramics, plastics, paints and other finely finished materials, and defects and geometries of parts in aerospace, automotive, power generation, semiconductor, data storage, bearings, additive manufacturing and other precision-machined components; interferometers for use in the testing of transmitted wavefront and surface shape of optical components, surface roughness of optics, metals, semiconductors, ceramics, plastics, paints and other finely finished materials, and defects and geometries of parts in aerospace, automotive, power generation, semiconductor, data storage, bearings, additive manufacturing and other precision-machined components; downloadable software, namely, process control and defect analysis software for use in the production of laminar substrates including discrete electronic components, semiconductors including non-volatile and volatile memory devices, foundry and logic devices, asic devices, cmos image sensors, microelectromechanical systems, light emitting diodes, and other micro and nano technology devices, system in package, heterogeneous packaging, and other advanced packaging electronics technologies; downloadable software for the semiconductor industry, namely, downloadable software for identifying defects in semiconductor structures, downloadable software for identifying semiconductor fabrication process excursions, downloadable software for recording and reviewing defects in semiconductors structures, downloadable software for identifying root causes of defects in semiconductor structures, and downloadable software for controlling and monitoring semiconductor fabrication equipment; metrology inspection equipment for use in the manufacturing, inspection, testing and repair of semiconductor substrates; metrology inspection equipment and devices, namely, instruments and devices that sense and capture images of semiconductor components, semiconductor wafers, semiconductor die, packaged integrated circuits, printed circuit boards, liquid crystal displays, electronic displays, and disk storage media, and inspect these images for defects, coordinate or position determination, identification, or presence or absence of a feature, characteristic or substance thereon; metrology inspection systems comprised of one or more light sources, one or more cameras and/or sensors in communication with embedded computer software and hardware used for the measurement of thickness, adhesion properties, and structural properties of semiconductor materials and for monitoring the performance of semiconductor fabrication processes; optical inspection equipment for 2D and 3D inspection of semiconductor materials; metrology instruments for metrology purposes, namely, apparatus for measuring physical dimensions of samples and thicknesses of deposited films or for analyzing chemical composition of materials, consisting of optical microscope, electron microscope, spectrophotometer, ellipsometer and scanning slit densitometers
First Use Date in General
14th Dec 1976
First Use Date in Commerce
14th Dec 1976
Class [007]
Machinery Products
Lithography machines for the manufacture of microelectronics, integrated circuits, light emitting diodes, and semiconductors on laminar substrates including wafers, glass panels, and packaging panels such as copper plate or plastic; Optical metrology, characterization, and inspection systems comprised of a machine, components and operating software therefor sold as a unit for use in the production of laminar substrates including discrete electronic components, semiconductors including non-volatile and volatile memory devices, foundry and logic devices, asic devices, cmos image sensors, microelectromechanical systems, light emitting diodes, and other micro and nano technology devices, system in package, heterogeneous packaging, and other advanced packaging electronics technologies; optical metrology, characterization, and inspection systems comprised of machine, components and operating software therefor sold as a unit for use in the production of precision machined optical surfaces, optical coatings, and optical assemblies including reference flat, sphere, asphere and assemblies composed of both refractive and reflective components
First Use Date in General
01st Sep 2023
First Use Date in Commerce
01st Sep 2023
Specimens
Mark Details
Serial Number
No 97308047
Mark Type
No Service Mark
Attorney Docket Number
No 15067155US02
44D Filed
No
44D Current
No
44E filed
No
44E Current
No
66A Filed
No
66A Current
No
Current Basis
No
No Basis
No
Legal History
| Status Date | Action Taken |
|---|---|
| 09th Jul 2024 | NOTICE OF REGISTRATION CONFIRMATION EMAILED |
| 09th Jul 2024 | REGISTERED-PRINCIPAL REGISTER |
| 31st May 2024 | NOTICE OF ACCEPTANCE OF STATEMENT OF USE E-MAILED |
| 31st May 2024 | ALLOWED PRINCIPAL REGISTER - SOU ACCEPTED |
| 29th May 2024 | STATEMENT OF USE PROCESSING COMPLETE |
| 28th May 2024 | CASE ASSIGNED TO INTENT TO USE PARALEGAL |
| 30th Apr 2024 | TEAS STATEMENT OF USE RECEIVED |
| 30th Apr 2024 | USE AMENDMENT FILED |
| 02th Dec 2023 | NOTICE OF APPROVAL OF EXTENSION REQUEST E-MAILED |
| 30th Nov 2023 | SOU EXTENSION 1 GRANTED |