About 25 Trademarks found that are owned by KabushIki Kaisha Hitachi Hightechnologies

Scanning electron microscopes; semiconductor wafer evaluation and inspection apparatus for use in semiconductor manufacturing and lithography; semiconductor and integrated circuit evaluation and inspection apparatus for use in semiconductor manufacturing, integrated circuit manufacturing, and lithography; software for evaluation and inspection of semiconductors and semiconductor wafers

DESIGN GAUGE-ANALYZER

The mark consists of four blue and gray linked circles, with a white and gray ring around them.

Comprehensive preventative maintenance services for critical dimension-scanning electron microscopes, maintenance services for critical dimension-scanning electron microscopes

[Scanning electron microscopes; semiconductor wafer evaluation and inspection apparatus for use in semiconductor manufacturing and lithography; semiconductor and integrated circuit evaluation and inspection apparatus for use in semiconductor manufacturing, integrated circuit manufacturing, and lithography;] software for evaluation and inspection of semiconductors and semiconductor wafers

TWO DP WA; TWO DPWA

An electrical current amplifier for semiconductor test and diagnostic apparatus; electrical current amplifier for scanning electron microscopes used in semiconductor testing and diagnosis

Scanning electron microscopes; scanning transmission electron microscopes; Focused ion beam system for the design, inspection and manufacture of semiconductors; compatible specimen holders for scanning electron microscopes, scanning transmission electron microscopes, scanning transmission electron microscopes, and focused ion beam systems; electronic devices to integrate focused ion beam systems with a scanning transmission electron microscope or a transmission electron microscope for the design, inspection and manufacture of semiconductors

Computer programs for use in the operation of Scanning Electron Microscopes (SEM) in the field of SEM metrology; computer programs for the manipulation, analysis, storage and management of SEM data and images; computer software platform for the management and integration of SEM (Scanning Electron Microscope) metrology applications software; data and image storage software; database management software; networking software for administration of computer networks

Computer servers and replacement components therefore; electrical component parts for computer servers; operating software for computer servers