on 16 May 2018
Last Applicant/ Owned by
1-24-14 Nishu Shimbashi, Minato-Ku
Tokyo
JP
1008220
Serial Number
78459607 filed on 30th Jul 2004
Registration Number
3538582 registered on 25th Nov 2008
Filing Basis
1. intent to use
2. use application currently
Disclaimer
NO DATA
[Scanning electron microscopes; semiconductor wafer evaluation and inspection apparatus for use in semiconductor manufacturing and lithography; semiconductor and integrated circuit evaluation and inspection apparatus for use in semiconductor manufacturing, integrated circuit manufacturing, and lithography;] software for evaluation and inspection of semiconductors and semiconductor wafers
[Scanning electron microscopes; semiconductor wafer evaluation and inspection apparatus for use in semiconductor manufacturing and lithography; semiconductor and integrated circuit evaluation and inspection apparatus for use in semiconductor manufacturing, integrated circuit manufacturing, and lithography;] software for evaluation and inspection of semiconductors and semiconductor wafers
31st Dec 2006
31st Dec 2006
No 78459607
No Service/Collective Mark
No 36605-6740US
No
No
No
No
No
No
No
No
Status Date | Action Taken |
---|---|
15th Jul 2020 | ASSIGNMENT OF OWNERSHIP NOT UPDATED AUTOMATICALLY |
16th May 2018 | REGISTERED AND RENEWED (FIRST RENEWAL - 10 YRS) |
16th May 2018 | REGISTERED - SEC. 8 (10-YR) ACCEPTED/SEC. 9 GRANTED |
16th May 2018 | CASE ASSIGNED TO POST REGISTRATION PARALEGAL |
16th May 2018 | NOTICE OF ACCEPTANCE OF SEC. 8 & 9 - E-MAILED |
07th May 2018 | TEAS SECTION 8 & 9 RECEIVED |
25th Nov 2017 | COURTESY REMINDER - SEC. 8 (10-YR)/SEC. 9 E-MAILED |
25th Nov 2014 | REGISTERED - SEC. 8 (6-YR) ACCEPTED & SEC. 15 ACK. |
25th Nov 2014 | NOTICE OF ACCEPTANCE OF SEC. 8 & 15 - E-MAILED |
25th Nov 2014 | CASE ASSIGNED TO POST REGISTRATION PARALEGAL |