on 17 Jun 2015
Last Applicant/ Owned by
TESCAN GROUP, a.s.
Libušina třída 863/21, CZ-623 00 Brno
, ,
Serial Number
UK00801274088 filed on 17th Jun 2015
Registration Number
UK00801274088 registered on
21st Sep 2016
Correspondent Address
Imperial House, 4-10 Donegall Square East, Belfast
Northern Ireland,
BT1 5HD
TESCAN ORSAY
Classification Information
Class [7]
Machinery Products
Electrical devices and machine tools for the manufacture of semiconductor parts, displays, data storage components, and objects for scientific research use, namely, electron and ion columns, namely, focused electron beam columns for electron lithography, electron beam microscopy and analysis, focused ion beam columns for ion lithography, imaging, and ion milling, secondary ion mass spectrometry; accessories for the above mentioned electrical devices and machine tools for use in the manufacture of semiconductor parts, displays, data storage components, and objects for scientific research use, such as, sample preparation equipment, namely equipment for preparation of samples to be machined or analysed by some of the above mentioned devices and machine tools.
Class [9]
Computer & Software Products & Electrical & Scientific Products
Microscopes, namely, electron microscopes, scanning electron microscopes, transmission electron microscopes, ion microscopes, raman microscopes, atomic force microscopes, holographic microscopes; scientific apparatus, namely electron sources for microscopes; scientific apparatus in the nature of ion sources for microscopes, namely, liquid-metal ion sources and plasma sources; focused ion beam tools and electron beam tools, namely, instruments for material deposition and removal and for imaging, analysis, and measurement of materials in the fields of microscopy and nanotechnology; optical apparatus, namely, electron beam lithography device; scientific instruments, namely, particle analyzers and classification instruments in the field of mineralogy; spectrometry scientific apparatus and instruments, namely, time-of-flight secondary ion mass spectrometry systems, X-ray and visible light spectrometry systems; lasers for nonmedical purposes; optical apparatus and instruments, namely, optical prisms, optical lenses, optical fibres, optical cables, optical mirrors; diaphragms for scientific apparatus; measuring instruments, namely, micrometer gauges; parts and fittings for all the aforesaid goods, namely, electron and ion detectors for electron and ion beam systems, electron detectors, secondary ions detectors, back scattered electron detectors, X-ray detectors, cathodoluminiscence detectors; parts and fittings for all the aforesaid scientific instruments namely, diffraction apparatus and diffraction detectors for microscopes, electron multipliers, photo multipliers, amplifiers, gas injection systems, electron flood guns, stages and nanomanipulators for microscopes, decontaminators, vacuum systems and gauges; microscopic system navigational software, namely, software that enhances the navigational, functional capability of microscopic, analytic, lithographic and spectroscopic components separately and/or in integrated systems; application software and operation system software for operation of all the foregoing equipment separately and/or in integrated systems, namely, software for use in microscopic imaging, milling, deposition and analysis; image processing software.
Class [37]
Construction and Repair Services
Service, maintenance and repair of microscopes, namely, electron microscopes, scanning electron microscopes, transmission electron microscopes, ion microscopes, raman microscopes, atomic force microscopes, holographic microscopes; service, maintenance and repair of scientific apparatus, namely, electron sources for microscopes, ion sources for microscopes, namely, liquid-metal ion sources and plasma sources; service, maintenance and repair of focused ion beam tools and electron beam tools, namely, instruments for material deposition and removal and for imaging, analysis, and measurement of materials in the fields of microscopy and nanotechnology; service, maintenance and repair of electron beam lithography apparatus; service, maintenance and repair of particle analyzers and classification instruments in the field of mineralogy; service, maintenance and repair of spectrometry systems, namely, time-of-flight secondary ion mass spectrometry systems, X-ray and visible light spectrometry systems; service, maintenance and repair of lasers and optical apparatus and instruments, namely, optical prisms, optical lenses, optical fibres, optical cables, optical mirrors; service, maintenance and repair of diaphragms for scientific apparatus; service, maintenance and repair of measuring instruments, namely, micrometer gauges; service, maintenance and repair of detectors for electron and ion beam systems, electron detectors, secondary ions detectors, back scattered electron detectors, X-ray detectors, cathodoluminiscence detectors; service, maintenance and repair of diffraction apparatus and diffraction detectors for microscopes, electron multiplier tubes, photo multipliers, amplifiers, gas injection systems, electron flood guns, stages and nanomanipulators for microscopes, decontaminators, vacuum systems and gauges.
Class [42]
Computer & Software Services & Scientific Services
Design, development and research services of the charged particle optical systems, namely electron microscopes, scanning electron microscopes, transmission electron microscopes, ion microscopes, raman microscopes, atomic force microscopes, holographic microscopes.
Mark Details
Serial Number
UK00801274088
Mark Type
Word
Kind of mark
Individual