About 30,000 Trademarks found for “weihai seaking nanometre technology co ltd”

surface measuring systems, namely, surface profilers and scatterometers of both contact and non-contact types for use in the machinery and equipment manufacture and electronics and semiconductor industries

Replacement parts for cranes

Integrated circuits; printed circuits; batteries, electric; battery chargers; regulating apparatus, electric; electronic speed controllers; remote control apparatus for radios, televisions, stereos; network communication equipment, namely, computer network hubs, mobile hotspot and rechargeable battery devices; computer peripheral devices; components for electrical mains in the nature of electric wires, connectors, circuit breakers, cables; electronic speed controllers for use in connection with remote controlled model toys

Belts for machines; pneumatic controls for machines, motors and engines; machines for the electronic industry for manufacturing computer hardware and circuit boards

wall and ceiling panels of metal

wall and ceiling panels of metal

Optical metrology, characterization, and inspection systems comprised of machine, components and operating software therefor sold as a unit for use in the testing of transmitted wavefront and surface shape of optical components, surface roughness of optics, metals, semiconductors, ceramics, plastics, paints and other finely finished materials, and defects and geometries of parts in aerospace, automotive, power generation, semiconductor, data storage, bearings, additive manufacturing and other precision-machined components; interferometers for use in the testing of transmitted wavefront and surface shape of optical components, surface roughness of optics, metals, semiconductors, ceramics, plastics, paints and other finely finished materials, and defects and geometries of parts in aerospace, automotive, power generation, semiconductor, data storage, bearings, additive manufacturing and other precision-machined components; downloadable software, namely, process control and defect analysis software for use in the production of laminar substrates including discrete electronic components, semiconductors including non-volatile and volatile memory devices, foundry and logic devices, asic devices, cmos image sensors, microelectromechanical systems, light emitting diodes, and other micro and nano technology devices, system in package, heterogeneous packaging, and other advanced packaging electronics technologies; downloadable software for the semiconductor industry, namely, downloadable software for identifying defects in semiconductor structures, downloadable software for identifying semiconductor fabrication process excursions, downloadable software for recording and reviewing defects in semiconductors structures, downloadable software for identifying root causes of defects in semiconductor structures, and downloadable software for controlling and monitoring semiconductor fabrication equipment; metrology inspection equipment for use in the manufacturing, inspection, testing and repair of semiconductor substrates; metrology inspection equipment and devices, namely, instruments and devices that sense and capture images of semiconductor components, semiconductor wafers, semiconductor die, packaged integrated circuits, printed circuit boards, liquid crystal displays, electronic displays, and disk storage media, and inspect these images for defects, coordinate or position determination, identification, or presence or absence of a feature, characteristic or substance thereon; metrology inspection systems comprised of one or more light sources, one or more cameras and/or sensors in communication with embedded computer software and hardware used for the measurement of thickness, adhesion properties, and structural properties of semiconductor materials and for monitoring the performance of semiconductor fabrication processes; optical inspection equipment for 2D and 3D inspection of semiconductor materials; metrology instruments for metrology purposes, namely, apparatus for measuring physical dimensions of samples and thicknesses of deposited films or for analyzing chemical composition of materials, consisting of optical microscope, electron microscope, spectrophotometer, ellipsometer and scanning slit densitometers

Lithography machines for the manufacture of microelectronics, integrated circuits, light emitting diodes, and semiconductors on laminar substrates including wafers, glass panels, and packaging panels such as copper plate or plastic; Optical metrology, characterization, and inspection systems comprised of a machine, components and operating software therefor sold as a unit for use in the production of laminar substrates including discrete electronic components, semiconductors including non-volatile and volatile memory devices, foundry and logic devices, asic devices, cmos image sensors, microelectromechanical systems, light emitting diodes, and other micro and nano technology devices, system in package, heterogeneous packaging, and other advanced packaging electronics technologies; optical metrology, characterization, and inspection systems comprised of machine, components and operating software therefor sold as a unit for use in the production of precision machined optical surfaces, optical coatings, and optical assemblies including reference flat, sphere, asphere and assemblies composed of both refractive and reflective components

scientific instruments used in the geophysical-geological fields, namely, seismological instruments, not including scientific instruments used in the field of metrology for measuring dimensions and thicknesses of deposited film or analyzing chemical compositions of materials or scientific instruments used for analyzing composite material in the form of ultra thin films, carbon nano tubes and nano and micro thick monolayers; Geophysical transducers, namely, electronic sensors for measuring seismic activity and vibrations, namely, accelerometers, and seismometers; Geophysical data collection systems, namely, seismological instruments, namely, seismographs, digital seismic recorders, seismic digitizers; communication systems for transmitting seismological information, namely, satellite systems comprised of satellite receivers, satellite dishes, satellite transmitters, satellite downconverters, satellite upconverters, satellite transceivers and satellite antennae

Installation, maintenance, and repair of laboratory apparatus and instruments in the field of seismology and geophysics

Golf clubs[, tennis rackets, ] and badminton rackets

scientific instruments, based principally upon optical microscope, electron microscope, spectrophotometer, ellipsometer and scanning slit densitometer technology, for metrology purposes, namely, apparatus for measuring physical dimensions of samples and thicknesses of deposited films or for analyzing chemical composition of materials

Ankle garters; Armbands; Barrettes; Belt clasps; Clothing buckles; Corset busks; Electric hair curlers, other than hand implements; False hair; Hair curlers, other than hand implements; Permanent botanicals in the nature of artificial flowers and plants, other than Christmas trees

The wording "SeakingFun" has no meaning in a foreign language.