About 1 Trademarks found for “TESCAN ORSAY”

Electrical devices and machine tools for the manufacture of semiconductor parts, displays, data storage components, and objects for scientific research use, namely, electron and ion columns, namely, focused electron beam columns for electron lithography, electron beam microscopy and analysis, focused ion beam columns for ion lithography, imaging, and ion milling, secondary ion mass spectrometry; accessories for the above mentioned electrical devices and machine tools for use in the manufacture of semiconductor parts, displays, data storage components, and objects for scientific research use, such as, sample preparation equipment, namely equipment for preparation of samples to be machined or analysed by some of the above mentioned devices and machine tools.

Microscopes, namely, electron microscopes, scanning electron microscopes, transmission electron microscopes, ion microscopes, raman microscopes, atomic force microscopes, holographic microscopes; scientific apparatus, namely electron sources for microscopes; scientific apparatus in the nature of ion sources for microscopes, namely, liquid-metal ion sources and plasma sources; focused ion beam tools and electron beam tools, namely, instruments for material deposition and removal and for imaging, analysis, and measurement of materials in the fields of microscopy and nanotechnology; optical apparatus, namely, electron beam lithography device; scientific instruments, namely, particle analyzers and classification instruments in the field of mineralogy; spectrometry scientific apparatus and instruments, namely, time-of-flight secondary ion mass spectrometry systems, X-ray and visible light spectrometry systems; lasers for nonmedical purposes; optical apparatus and instruments, namely, optical prisms, optical lenses, optical fibres, optical cables, optical mirrors; diaphragms for scientific apparatus; measuring instruments, namely, micrometer gauges; parts and fittings for all the aforesaid goods, namely, electron and ion detectors for electron and ion beam systems, electron detectors, secondary ions detectors, back scattered electron detectors, X-ray detectors, cathodoluminiscence detectors; parts and fittings for all the aforesaid scientific instruments namely, diffraction apparatus and diffraction detectors for microscopes, electron multipliers, photo multipliers, amplifiers, gas injection systems, electron flood guns, stages and nanomanipulators for microscopes, decontaminators, vacuum systems and gauges; microscopic system navigational software, namely, software that enhances the navigational, functional capability of microscopic, analytic, lithographic and spectroscopic components separately and/or in integrated systems; application software and operation system software for operation of all the foregoing equipment separately and/or in integrated systems, namely, software for use in microscopic imaging, milling, deposition and analysis; image processing software.