SU - NON-FINAL ACTION - MAILED
non
on 30 May 2024
Last Applicant/ Owned by
16 Jonspin Road
Wilmington
MA
01887
Serial Number
97308042 filed on 11th Mar 2022
Registration Number
N/A
Correspondent Address
Heather J. Kliebenstein
Filing Basis
1. intent to use
2. intent to use current
Disclaimer
NO DATA
RUDOLPH
Providing temporary use on online, non-downloadable process control and defect analysis software for use in the production of laminar substrates including discrete electronic components, semiconductors including non-volatile and volatile memory devices, foundry and logic devices, asic devices, cmos image sensors, microelectromechanical systems, light emitting diodes, and other micro and nano techn Read More
Classification Information
Class [042]
Computer & Software Services & Scientific Services
Providing temporary use on online, non-downloadable process control and defect analysis software for use in the production of laminar substrates including discrete electronic components, semiconductors including non-volatile and volatile memory devices, foundry and logic devices, asic devices, cmos image sensors, microelectromechanical systems, light emitting diodes, and other micro and nano technology devices, system in package, heterogenous packaging, and other advanced packaging electronics technologies
First Use Date in General
29th Mar 2024
First Use Date in Commerce
29th Mar 2024
Class [009]
Computer & Software Products & Electrical & Scientific Products
Optical metrology, characterization, and inspection systems comprised of machine, components and operating software therefor sold as a unit for use in the testing of transmitted wavefront and surface shape of optical components, surface roughness of optics, metals, semiconductors, ceramics, plastics, paints and other finely finished materials, and defects and geometries of parts in aerospace, automotive, power generation, semiconductor, data storage, bearings, additive manufacturing and other precision-machined components; interferometers for use in the testing of transmitted wavefront and surface shape of optical components, surface roughness of optics, metals, semiconductors, ceramics, plastics, paints and other finely finished materials, and defects and geometries of parts in aerospace, automotive, power generation, semiconductor, data storage, bearings, additive manufacturing and other precision-machined components; downloadable software, namely, process control and defect analysis software for use in the production of laminar substrates including discrete electronic components, semiconductors including non-volatile and volatile memory devices, foundry and logic devices, asic devices, cmos image sensors, microelectromechanical systems, light emitting diodes, and other micro and nano technology devices, system in package, heterogeneous packaging, and other advanced packaging electronics technologies; Scientific instruments, based principally upon optical microscope, electron microscope, spectrophotometer, ellipsometer and scanning slit densitometer technology, for metrology purposes, namely, apparatus for measuring physical dimensions of samples and thicknesses of deposited films or for analyzing chemical composition of materials
First Use Date in General
31st Dec 1930
First Use Date in Commerce
31st Dec 1930
Class [007]
Machinery Products
Lithography machines for the manufacture of microelectronics, integrated circuits, light emitting diodes, and semiconductors on laminar substrates including wafers, glass panels, and packaging panels such as copper plate or plastic; optical metrology, characterization, and inspection systems comprised of a machine, components and operating software therefor sold as a unit for use in the production of laminar substrates including discrete electronic components, semiconductors including non-volatile and volatile memory devices, foundry and logic devices, asic devices, cmos image sensors, microelectromechanical systems, light emitting diodes, and other micro and nano technology devices, system in package, heterogeneous packaging, and other advanced packaging electronics technologies; optical metrology, characterization, and inspection systems comprised of machine, components and operating software therefor sold as a unit for use in the production of precision machined optical surfaces, optical coatings, and optical assemblies including reference flat, sphere, asphere and assemblies composed of both refractive and reflective components
First Use Date in General
12th Dec 2012
First Use Date in Commerce
12th Dec 2012
Mark Details
Serial Number
No 97308042
Mark Type
No Service Mark
Attorney Docket Number
No 15067174US02
44D Filed
No
44D Current
No
44E filed
No
44E Current
No
66A Filed
No
66A Current
No
Current Basis
No
No Basis
No
Legal History
| Status Date | Action Taken |
|---|---|
| 25th Nov 2024 | TEAS RESPONSE TO OFFICE ACTION RECEIVED |
| 29th Aug 2024 | APPLICATION EXTENSION TO RESPONSE PERIOD - RECEIVED |
| 29th Aug 2024 | APPLICATION EXTENSION GRANTED/RECEIPT PROVIDED |
| 30th May 2024 | NOTIFICATION OF NON-FINAL ACTION E-MAILED |
| 30th May 2024 | SU - NON-FINAL ACTION - WRITTEN |
| 30th May 2024 | NON-FINAL ACTION E-MAILED |
| 29th May 2024 | STATEMENT OF USE PROCESSING COMPLETE |
| 28th May 2024 | CASE ASSIGNED TO INTENT TO USE PARALEGAL |
| 30th Apr 2024 | USE AMENDMENT FILED |
| 30th Apr 2024 | TEAS STATEMENT OF USE RECEIVED |