About 9 Trademarks found that are owned by Xenocs Sas

Optical devices and instruments, namely reflecting optical components and devices for influencing radiation, especially short-wavelength radiation, especially flat and curved optical mirrors, not including optical components and devices used in connection with infrared radiation and not including detectors and laser sources

Arranging and conducting of symposiums; arranging and conducting of congresses; arranging and conducting conferences and seminars; archive library services; computer based library services; electronic library services; arrangement of training courses in teaching institutes; arranging and conducting of colloquiums; arranging and conducting workshops; computer education training; conducting instructional courses; conducting of educational courses in science; Arranging and conducting of training courses relating to science; Arranging and conducting of training courses relating to engineering; correspondence courses; Arranging and conducting of training postgraduate training courses; rental and leasing in relation to the aforesaid services, namely, book rental; consultancy and information in relation to the aforesaid services; all the aforesaid services in particular relating to small-angle x-ray scattering for examining material structures, in particular in combination with wide-angle x-ray scattering for examining crystal properties, in particular for materials research in the field of nanomaterials, polymers, soft matter, colloids, complex fluids, including liquid crystals, protein solutions, thin nanostructured films, and particle size analysis

Measuring, detecting and monitoring instruments, indicators and controllers, namely, X-ray apparatus not for medical purposes in the nature of small angle x-ray scattering instruments and wide angle x-ray scattering instruments; optical devices, enhancers and correctors, namely, spectrometers being scientific apparatus; scientific research and laboratory apparatus, educational apparatus and simulators, namely, x-ray apparatus, not for medical purposes; radiological apparatus for industrial purposes, namely, X-ray apparatus not for medical purposes in the nature of small angle x-ray scattering instruments and wide angle x-ray scattering instruments; x-ray fluorescence analyzers, other than for medical purposes, used for analyzing crystalline structure of nanomaterials and for examining nanoscale properties of materials such as shape and size of structures; X-ray apparatus not for medical purposes in the nature of small angle and wide angle x-ray scattering instruments used separately or in combination for examining crystal properties for materials research and development or for analyzing the shape, sizes, molecular weight, interactions, aggregation and conformational state of proteins, biological macromolecules in solution; particle detecting apparatus, namely, X-ray apparatus not for medical purposes in the nature of x-ray scattering instruments for measuring nanoscale particle size analysis in the field of nanomaterials, polymers, soft matter, colloids, complex fluids, liquid crystals, protein solutions and thin nanostructured films; electro-optical sensors for measuring distance to an object, not for medical use; interfaces for detectors; magnetic object detectors; optical sensors; X-ray apparatus not for medical purposes in the nature of small angle and wide angle x-ray scattering instruments for measuring nanoscale particle sizes; photoelectric sensors for measuring distance to an object, not for medical use; photoionic detectors, namely, gas detectors for detecting the presence of gas; measuring devices, electric, namely, clamp meters for measuring electricity; Surveying instruments for surveying physical data; radiation measuring instruments; measuring instruments, namely, optical time-domain reflectometers; scientific apparatus, namely, spectrometers; data processing equipment, namely, couplers, computers; Downloadable computer software, in particular for scientific applications, in particular for structure modelling of nanomaterials; x-ray producing apparatus and installations, not for medical purposes, namely, X-ray apparatus not for medical purposes; radiological apparatus for industrial purposes, namely, radiation-measuring instruments; x-ray fluorescence analysers, other than for medical purposes; scientific apparatus and instruments, in particular X-ray apparatus not for medical purposes in the nature of small-angle x-ray scattering instruments for examining material structures, in particular in combination with wide-angle x-ray scattering instruments for examining crystal properties, in particular for materials research in the field of nanomaterials, polymers, soft matter, colloids, complex fluids, including liquid crystals, protein solutions, thin nanostructured films, and particle size analysis; structural and replacement parts and fittings for all the aforesaid goods

Measuring apparatus and instruments, namely X-ray apparatus not for medical purposes in the nature of x-ray radiography instruments, x-ray imaging instruments, x-ray scattering instruments; scientific apparatus and instruments, namely, X-ray apparatus not for medical purposes in the nature of X-ray radiography instruments, X-ray imaging instruments, x-ray scattering instruments, for examining material structures and particle size analysis; sensors for measuring distance to an object, not for medical use; laboratory apparatus and instruments, namely, X-ray apparatus not for medical purposes, optical time-domain reflectometers, X-ray imaging modules for X-ray apparatus not for medical purposes in the nature of X-ray scattering measurements, X-ray apparatus not for medical purposes in the nature of X-ray radiography instruments and X-ray imaging apparatus; measuring, regulating and testing apparatus, namely, x-ray fluorescence analyzers, other than for medical purposes, used for analyzing crystalline structure of nanomaterials and for examining nanoscale properties of materials such as shape and size of structures and for analysis of the macrostructure of materials; apparatus and instruments for industrial process monitoring and control, namely, X-ray apparatus not for medical purposes in the nature of X-ray scattering instruments; structural parts and fittings for the above goods; downloadable software for scientific applications, in particular for modelling the structure of nanomaterials and computer hardware; all of the aforesaid goods being specifically in connection with x-ray apparatus, in particular with x-ray radiography apparatus or x-ray imaging not for medical purposes, in particular in combination with small-angle x-ray scattering and/or wide-angle x-ray scattering; all of the aforesaid goods being specifically used for materials research, development or production control in the field of polymers, nanocomposites, biomaterials, alloys, in particular for analysis of the macrostructure at several microns to centimeter scale, in particular for detection of structural inhomogeneities, defects, voids, pores, aggregations, and interfaces in such materials

NANO INXIDER

The word(s) "Nanoinxider" has no meaning in a foreign language.

Downloadable and recorded software for analyzing and identifying nanostructures, in particular size, configuration and orientation, or atomic-scale structures of soft matter or nanostructured materials, in particular polymers, surfactants, colloids, nanomaterials, porous materials, liquid crystals; Downloadable and recorded software for identifying characteristic dimensions on the atomic scale, the nanoscale or the mesoscale based on material analysis by means of small-angle X-ray scattering, ultra-small-angle X-ray scattering or wide-angle X-ray scattering; Downloadable and recorded software for processing X-ray scattering data collected by means of analyzing small-angle X-ray scattering, ultra-small-angle X-ray scattering or wide-angle X-ray scattering, and for visualizing data; Downloadable and recorded software for providing information relating to the size distribution of nanoparticles, relating to the size and configuration of nano-objects or nanoparticles in nanostructured materials, relating to fractal dimensions, relating to the crystalline proportion of semi-crystalline materials; Downloadable and recorded software for analyzing crystalline phases, nanoscale coatings for macromolecules in solutions, including proteins; Downloadable and recorded software for analyzing the orientation of nanostructures in thin films or deformed or stressed materials

Arranging and conducting of symposiums in the field of characterization of nanomaterials, polymers, soft matter, colloids, complex fluids, liquid crystals, protein solutions, thin nanostructured films and particle size analysis; Arranging and conducting of congresses in the field of characterization of nanomaterials, polymers, soft matter, colloids, complex fluids, liquid crystals, protein solutions, thin nanostructured films and particle size analysis; Arranging and conducting conferences and seminars in the field of characterization of nanomaterials, polymers, soft matter, colloids, complex fluids, liquid crystals, protein solutions, thin nanostructured films and particle size analysis for education and entertainment purposes; Archive library services; Computer based library services; Electronic library services; Arrangement of training courses in the field of characterization of nanomaterials, polymers, soft matter, colloids, complex fluids, liquid crystals, protein solutions, thin nanostructured films and particle size analysis; Arranging and conducting of colloquiums in the field of characterization of nanomaterials, polymers, soft matter, colloids, complex fluids, liquid crystals, protein solutions, thin nanostructured films and particle size analysis; Arranging and conducting of training workshops in the field of characterization of nanomaterials, polymers, soft matter, colloids, complex fluids, liquid crystals, protein solutions, thin nanostructured films and particle size analysis; Computer education training; Conducting of educational courses in the field of science; Training courses in the field of science; Training courses in the field of engineering; Correspondence courses in the field of characterization of nanomaterials, polymers, soft matter, colloids, complex fluids, liquid crystals, protein solutions, thin nanostructured films and particle size analysis; Postgraduate training courses in the field of characterization of nanomaterials, polymers, soft matter, colloids, complex fluids, liquid crystals, protein solutions, thin nanostructured films and particle size analysis; Consultancy and providing information in relation to the aforesaid services, included in this class for educational and entertainment purpose; All the aforesaid services in particular relating to small-angle X-ray scattering for examining material structures, in particular in combination with wide-angle X-ray scattering for examining crystal properties, in particular for materials research in the field of nanomaterials, polymers, soft matter, colloids, complex fluids, including liquid crystals, protein solutions, thin nanostructured films, and particle size analysis

Apparatus and instruments for conveying, distributing, transforming, storing, regulating or controlling electric current; cables for electricity; Apparatus for treatment by means of electricity, namely, electrical integrated control systems for use in the field of X-ray scattering analysis of nanomaterials and nanoscale properties of materials such as shape and size of structures; Information technology and audiovisual equipment, namely, computers and computer screens; Measuring, detecting and monitoring instruments, indicators and controllers, namely, small angle X-ray scattering instruments and wide angle X-ray scattering instruments; Optical devices, enhancers and correctors, namely, spectrometers; Scientific research and laboratory apparatus, educational apparatus and simulators, namely, X-ray apparatus, not for medical purposes; Radiological apparatus for industrial purposes, namely, small angle X-ray scattering instruments and wide angle X-ray scattering instruments; X-ray analyzers, other than for medical purposes, used for analyzing crystalline structure of nanomaterials and for examining nanoscale properties of materials such as shape and size of structures; Small angle and wide angle X-ray scattering instruments used separately or in combination for examining crystal properties for materials research and development or for analyzing the shape, sizes, molecular weight, interactions, aggregation and conformational state of proteins, RNA or biological macromolecules in solution; Particle detecting apparatus, namely, X-ray scattering instruments for measuring nanoscale particle size analysis in the field of nanomaterials, polymers, soft matter, colloids, complex fluids, liquid crystals, protein solutions and thin nanostructured films; X-ray detection apparatus, visible light detection apparatus, infrared detection apparatus and UV detection apparatus; Electronic sensors; Electro-optical sensors; Interfaces for detectors; Magnetic object detectors; Optical sensors; Small angle and wide angle X-ray scattering instruments for measuring nanoscale particle sizes; Photoelectric sensors; Photoionic detectors; Measuring devices, electric, namely, clamp meters for measuring electricity; Instruments for surveying physical data; Radiation-measuring instruments; optical time-domain reflectometers; Scientific apparatus, namely, spectrometers; Data processing equipment, namely, couplers, computers; Computer software, in particular for scientific applications, in particular for structure modelling of nanomaterials; X-ray producing apparatus and installations, not for medical purposes; Radiological apparatus for industrial purposes; X-ray analysers, other than for medical purposes; Scientific apparatus and instruments, in particular small-angle X-ray scattering instruments for examining material structures, in particular in combination with wide-angle X-ray scattering instruments for examining crystal properties, in particular for materials research in the field of nanomaterials, polymers, soft matter, colloids, complex fluids, including liquid crystals, protein solutions, thin nanostructured films, and particle size analysis; structural and replacement parts and fittings for all the aforesaid goods, included in this class

GENICS

Scientific and industrial research, engineering, technical consulting and testing of materials, all in the field of scientific and industrial optics

(Based on 44(d) Priority Application) Measuring apparatus and instruments, namely X-ray apparatus not for medical purposes in the nature of x-ray radiography instruments, x-ray imaging instruments, x-ray scattering instruments; Scientific apparatus and instruments, namely, X-ray apparatus not for medical purposes in the nature of X-ray radiography instruments, X-ray imaging instruments, x-ray scattering instruments, for examining material structures and particle size analysis; Sensors for measuring distance to an object, not for medical use; Laboratory apparatus and instruments, namely, X-ray apparatus not for medical purposes, optical time-domain reflectometers, X-ray imaging modules for X-ray apparatus not for medical purposes in the nature of X-ray scattering measurements, X-ray apparatus not for medical purposes in the nature of X-ray radiography instruments and X-ray imaging apparatus; Measuring, regulating and testing apparatus, namely, x-ray fluorescence analyzers, other than for medical purposes, used for analyzing crystalline structure of nanomaterials and for examining nanoscale properties of materials such as shape and size of structures and for analysis of the macrostructure of materials; Display and checking (supervision) apparatus; Apparatus and instruments for industrial process monitoring and control, namely, X-ray apparatus not for medical purposes in the nature of X-ray scattering instruments; downloadable software for scientific applications, materials research, and/or for modelling the structure of nanomaterials and computer hardware; Measuring, detecting and monitoring instruments, indicators and controllers, namely, X-ray imaging instruments for materials research, small angle X-ray scattering instruments and wide angle X-ray scattering instruments; Optical devices, enhancers and correctors, namely, spectrometers; Scientific research and laboratory apparatus, educational apparatus and simulators, namely, X-ray apparatus, not for medical purposes; Radiological apparatus for industrial purposes, namely, X-ray imaging instruments for materials research, small angle X-ray scattering instruments and wide angle X-ray scattering instruments; X-ray analyzers, other than for medical purposes, used for analyzing crystalline structure of nanomaterials and for examining nanoscale properties of materials such as shape and size of structures; X-ray imaging instruments, small angle and wide angle X-ray scattering instruments used separately or in combination for examining crystal properties for materials research and development or for analyzing the shape, sizes, molecular weight, interactions, aggregation and conformational state of proteins, RNA or biological macromolecules in solution; Particle detecting apparatus, namely, X-ray scattering instruments for measuring nanoscale particle size analysis in the field of nanomaterials, polymers, soft matter, colloids, complex fluids, liquid crystals, protein solutions and thin nanostructured films; X-ray detection apparatus, visible light detection apparatus, infrared detection apparatus and UV detection apparatus; Electronic sensors; Electro-optical sensors; Interfaces for detectors; Magnetic object detectors; Optical sensors; X-ray imaging instruments for materials research, small angle and wide angle X-ray scattering instruments for measuring nanoscale particle sizes and particle size analysis; Photoelectric sensors; Photoionic detectors; Measuring devices, electric, namely, clamp meters for measuring electricity; Instruments for surveying physical data; Radiation-measuring instruments; optical time-domain reflectometers; Scientific apparatus, namely, spectrometers; Data processing equipment, namely, computers; Computer software, in particular for scientific applications, in particular for structure modelling of nanomaterials; X-ray producing apparatus and installations, not for medical purposes; Radiological apparatus for industrial purposes; X-ray analysers, other than for medical purposes; structural and replacement parts and fittings for all the aforesaid goods; (Based on 44(e)) ; Measuring apparatus and instruments, namely X-ray apparatus not for medical purposes in the nature of x-ray radiography instruments, x-ray imaging instruments, x-ray scattering instruments; Scientific apparatus and instruments, namely, X-ray apparatus not for medical purposes in the nature of X-ray radiography instruments, X-ray imaging instruments, x-ray scattering instruments, for examining material structures and particle size analysis; Sensors for measuring distance to an object, not for medical use; Laboratory apparatus and instruments, namely, X-ray apparatus not for medical purposes, optical time-domain reflectometers, X-ray imaging modules for X-ray apparatus not for medical purposes in the nature of X-ray scattering measurements, X-ray apparatus not for medical purposes in the nature of X-ray radiography instruments and X-ray imaging apparatus; Measuring, regulating and testing apparatus, namely, x-ray fluorescence analyzers, other than for medical purposes, used for analyzing crystalline structure of nanomaterials and for examining nanoscale properties of materials such as shape and size of structures and for analysis of the macrostructure of materials; Display and checking (supervision) apparatus; Apparatus and instruments for industrial process monitoring and control, namely, X-ray apparatus not for medical purposes in the nature of X-ray scattering instruments; downloadable software for scientific applications, materials research, and/or for modelling the structure of nanomaterials and computer hardware; Measuring, detecting and monitoring instruments, indicators and controllers, namely, X-ray imaging instruments for materials research, small angle X-ray scattering instruments and wide angle X-ray scattering instruments; Optical devices, enhancers and correctors, namely, spectrometers; Scientific research and laboratory apparatus, educational apparatus and simulators, namely, X-ray apparatus, not for medical purposes; Radiological apparatus for industrial purposes, namely, X-ray imaging instruments for materials research, small angle X-ray scattering instruments and wide angle X-ray scattering instruments; X-ray analyzers, other than for medical purposes, used for analyzing crystalline structure of nanomaterials and for examining nanoscale properties of materials such as shape and size of structures; X-ray imaging instruments, small angle and wide angle X-ray scattering instruments used separately or in combination for examining crystal properties for materials research and development or for analyzing the shape, sizes, molecular weight, interactions, aggregation and conformational state of proteins, RNA or biological macromolecules in solution; Particle detecting apparatus, namely, X-ray scattering instruments for measuring nanoscale particle size analysis in the field of nanomaterials, polymers, soft matter, colloids, complex fluids, liquid crystals, protein solutions and thin nanostructured films; X-ray detection apparatus, visible light detection apparatus, infrared detection apparatus and UV detection apparatus; Electronic sensors; Electro-optical sensors; Interfaces for detectors; Magnetic object detectors; Optical sensors; X-ray imaging instruments for materials research, small angle and wide angle X-ray scattering instruments for measuring nanoscale particle sizes and particle size analysis; Photoelectric sensors; Photoionic detectors; Measuring devices, electric, namely, clamp meters for measuring electricity; Instruments for surveying physical data; Radiation-measuring instruments; optical time-domain reflectometers; Scientific apparatus, namely, spectrometers; Data processing equipment, namely, computers; Computer software, in particular for scientific applications, in particular for structure modelling of nanomaterials; X-ray producing apparatus and installations, not for medical purposes; Radiological apparatus for industrial purposes; X-ray analysers, other than for medical purposes; structural and replacement parts and fittings for all the aforesaid goods

(Based on 44(d) Priority Application) Advisory services relating to science, namely, scientific research consulting; Advisory services relating to scientific instruments, namely, product development consultation; scientific analytical laboratory services; Calibration of instruments; Professional consultancy relating to technology; Industrial research; Scientific analytical laboratory services; Leasing of scientific instruments, namely, rental of laboratory apparatus and instruments; Rental of measuring apparatus; Preparation of project analysis studies and analysis, namely, scientific research; scientific research consulting, namely, preparation of reports relating to scientific research; Preparation of technical manuals, namely, scientific research; Providing science technology information; Provision of scientific information; product research and development services; product research in instrumentation; product research in measurement technology; Scientific research consulting; scientific and technological research services, namely, scientific research, analysis, testing; rental and leasing in relation to the aforesaid services, namely, rental of laboratory apparatus and instruments and rental of measuring apparatus; Consultancy and information in relation to the aforesaid services; all the aforesaid services in particular relating to, X-ray imaging for materials research, or X-ray scattering for examining material structures and crystal properties; the fields of nanomaterials, polymers, soft matter, colloids, complex fluids, liquid crystals, protein solutions, thin nanostructured films, and particle size analysis; materials research, development and production control in the fields of polymers, nanocomposites, biomaterials, alloys; analysis of the macrostructure; detection of structural inhomogeneities, defects, voids, pores, aggregations, interfaces in materials; (Based on 44(e)) ; Advisory services relating to science, namely, scientific research consulting; Advisory services relating to scientific instruments, namely, product development consultation; scientific analytical laboratory services; Calibration of instruments; Professional consultancy relating to technology; Industrial research; Scientific analytical laboratory services; Leasing of scientific instruments, namely, rental of laboratory apparatus and instruments; Rental of measuring apparatus; Preparation of project analysis studies and analysis, namely, scientific research; scientific research consulting, namely, preparation of reports relating to scientific research; Preparation of technical manuals, namely, scientific research; Providing science technology information; Provision of scientific information; product research and development services; product research in instrumentation; product research in measurement technology; Scientific research consulting; scientific and technological research services, namely, scientific research, analysis, testing; rental and leasing in relation to the aforesaid services, namely, rental of laboratory apparatus and instruments and rental of measuring apparatus; Consultancy and information in relation to the aforesaid services; all the aforesaid services in particular relating to, X-ray imaging for materials research, or X-ray scattering for examining material structures and crystal properties; the fields of nanomaterials, polymers, soft matter, colloids, complex fluids, liquid crystals, protein solutions, thin nanostructured films, and particle size analysis; materials research, development and production control in the fields of polymers, nanocomposites, biomaterials, alloys; analysis of the macrostructure; detection of structural inhomogeneities, defects, voids, pores, aggregations, interfaces in materials