| NGR TASMIT, INC.
76423951 19 Jun 2002 | on 18 Oct 2024
| SEMICONDUCTOR TESTERS; ELECTRIC METERS FOR INSPECTING SEMICONDUCTOR AN... Class 009 Class 009 Computer & Software Products & Electrical & Scientific Products SEMICONDUCTOR TESTERS; ELECTRIC METERS FOR INSPECTING SEMICONDUCTOR AND FOR TESTING INTEGRATED CIRCUITS; MAGNETIC METERS NAMELY VOLTMETERS, CHRONOMETERS, DYNAMETERS AND SOUND LEVEL METERS AND VOLTAGE AND AMPERAGE TESTERS AND PROBES FOR TESTING INTEGRATED CIRCUITS; ELECTRON MICROSCOPES | | | NANOGEOMETRY TASMIT, INC.
76423952 19 Jun 2002 | on 18 Oct 2024
| SEMICONDUCTOR TESTERS; ELECTRIC METERS FOR INSPECTING SEMICONDUCTORS A... Class 009 Class 009 Computer & Software Products & Electrical & Scientific Products SEMICONDUCTOR TESTERS; ELECTRIC METERS FOR INSPECTING SEMICONDUCTORS AND FOR TESTING INTEGRATED CIRCUITS; MAGNETIC METERS NAMELY VOLTMETERS, CHRONOMETERS, DYNAMETERS AND SOUND LEVEL METERS AND VOLTAGE AND AMPERAGE TESTERS AND PROBES FOR TESTING INTEGRATED CIRCUITS; ELECTRON MICROSCOPES | | | TASMIT TASMIT, Inc.
88729675 17 Dec 2019 | on 08 Jun 2021
| Measuring instruments, namely, machine that measures pattern defects a... Class 007 Class 007 Machinery Products Measuring instruments, namely, machine that measures pattern defects and critical dimensions of semiconductor devices; Electric and magnetic meters; Semiconductor device testers in the nature of semiconductor testing apparatus; Electronic machines and apparatus, namely, semiconductor wafer geometry verification system and structural parts therefor; Semiconductor inspection equipment, namely, optical inspection apparatus for inspection of semiconductor materials, in particular, semiconductor wafers and electron beam semiconductor wafer pattern verification system and structural parts therefor; Inspection equipment for electrical characteristics of semiconductors, namely, optical inspection apparatus for inspection of semiconductor materials, in particular, semiconductor wafers; Electron microscopes; Semi-conductors; Semiconductor testing apparatus Class 009 Class 009 Computer & Software Products & Electrical & Scientific Products Measuring instruments, namely, machine that measures pattern defects and critical dimensions of semiconductor devices; Electric and magnetic meters; Semiconductor device testers in the nature of semiconductor testing apparatus; Electronic machines and apparatus, namely, semiconductor wafer geometry verification system and structural parts therefor; Semiconductor inspection equipment, namely, optical inspection apparatus for inspection of semiconductor materials, in particular, semiconductor wafers and electron beam semiconductor wafer pattern verification system and structural parts therefor; Inspection equipment for electrical characteristics of semiconductors, namely, optical inspection apparatus for inspection of semiconductor materials, in particular, semiconductor wafers; Electron microscopes; Semi-conductors; Semiconductor testing apparatus Class 042 Computer & Software Services & Scientific Services Semiconductor manufacturing machines and systems | | | INSPECTRA TASMIT, Inc.
98437802 07 Mar 2024 | on 26 Nov 2024 | Optical inspection apparatus for visually inspecting semiconductor waf... Class 009 Class 009 Computer & Software Products & Electrical & Scientific Products Optical inspection apparatus for visually inspecting semiconductor wafers; Optical inspection apparatus for inspecting the appearance of semiconductor wafers; Inspection machines for the optical inspection of semiconductor wafers; Inspection machines for the optical inspection of the appearance of semiconductor wafers; Optical inspection apparatus for visually inspecting the glass substrates in rectangular shape of semiconductor; Optical inspection apparatus for inspecting the appearance of glass substrates in rectangular shape of semiconductor; Inspection machines for the optical inspection of glass substrates in rectangular shape of semiconductor; Inspection machines for the optical inspection of the appearance of glass substrates in rectangular shape of semiconductor | | 
