About 14 Trademarks found that are owned by Rudolph Technologies Inc.

Computer software for data and yield management and analysis in semiconductor manufacturing

MICRO-COMPUTER CONTROLLED AUTOMATIC ELLIPSOMETER

computer software for the semiconductor inspection, namely, after-develop inspection and automated defect detection

computer software for process and yield modeling, image archiving and yield optimization

Computer software for identifying and reporting yield-affecting process excursions across single and multiple location manufacturing supply chain operations in the semiconductor device fabrication industry

SEMICONDUCTOR INDUSTRIAL TEST AND MEASUREMENT EQUIPMENT, NAMELY, SEMICONDUCTOR PROBE CARD ANALYSIS AND REWORK STATIONS COMPUTER HARDWARE AND SOFTWARE

Probe card metrology system comprised of hardware and software for use in the manufacturing, testing and repair of probe cards used in the testing of semiconductor wafers

ellipsometers

Inspection and metrology equipment and devices, namely, instruments and devices that sense and/or capture images of semiconductor and electronic related components, primarily semiconductor wafers, semiconductor die, packaged integrated circuits, printed circuit boards, liquid crystal displays, electronic displays, and disk storage media, and automatically inspect these images for information such as defects, coordinate or position determination, identification, and/or presence or absence of a feature, characteristic or substance thereon

Hardware and software systems comprising computers, computer software, electronic hardware and mechanical hardware for micropositioning control, namely, the design, manufacture and application of micropositioning control in precision actuators, control systems for photonics, digital flow control, semiconductor test and inspection, and biomedical microscopy and scanning systems