About 13 Trademarks found that are owned by Nova Measuring Instruments Ltd

The mark consists of the letters "NOV" in (R 000 G 022 B 100; C 100 M 100 Y000 K030; pantone 2756 C, pantone 281 U) and the letter "A" in (RGB 180 20 135, CMYK 10 100 00, pantone 225C, pantone, Rhodamin Redu; RGB 108 0 225; CMYK 75 70 0 0, Pantone Violet C, Pantone Violet U).

X-Ray monitoring, measurement and inspection equipment for characterizing dimensional and/or material properties of samples, namely, for measuring and inspecting patterned structures and films in the field of semiconductor manufacturing, and systems comprised of hardware and recorded software for process control of semiconductors manufacturing, and recorded computer operating programs for use therewith

Optical monitoring, measurement and inspection equipment for measuring physical dimensions of samples, thicknesses of films and for analyzing chemical composition of materials, and systems comprised of hardware and software for process control, and computer operating programs for use therewith

Color is not claimed as a feature of the mark.

Optical test equipment, namely, monitoring, measuring and inspection instruments and computer operating systems thereof, computer hardware and software for product quality control in the field of semiconductor manufacturing; monitoring, measurement and inspection equipment systems comprised of monitoring, measuring and inspection instruments and computer operating systems thereof for process control of semiconductors manufacturing

X-ray and electronic apparatus for the non-destructive evaluation of solid materials

Optical test equipment and measuring instruments, and computer operating systems thereof, computer software and hardware, all for product quality control in the semiconductor manufacture

NOVA TRACK

semiconductor metrology instrument for measuring crystallographic texture of copper on wafers

Optical test equipment, namely, monitoring, measuring and inspection instruments and computer operating systems thereof, computer hardware and software all for product quality control in the field of semiconductor manufacturing