About 13 Trademarks found that are owned by Nanoworld Ag

[ Scientific, surveying, electric, optical, and measuring apparatus and instruments, namely, scanning probe microscopes, scanning electron microscopes and atomic force microscopes; ] electric and electronic and micro-mechanical and micro-electromechanical sensors and probes for non-optical microscopes and optical near field microscopes; electric and electronic and micro-mechanical and micro-electromechanical sensors for detection of pressure, gases, temperature, intensity of light, forces, acceleration, vibrations, nick angle, humidity, distances, speed, roughness, thickness, acoustic waves, and molecules, for measuring surface topography, height, electrical and magnetical surface properties, potentials and currents; electric and electronic and micro-mechanical and micro-electromechanical sensors and probes for atomic force microscopy, for scanning probe microscopy, and for scanning electron microscopy; electric and electronic and micro-mechanical and micro-electromechanical sensors comprised of micro-mechanical cantilevers and membranes

sensors for scanning force microscopy; tips in the nature of micromachined protrusions on the end of flexible cantilevers for measuring the profile of a surface

MICROMASCH

Issue New Certificate to: Nanoworld AG (Switzerland Corporation) Rue Jaquet-Droz 1 Neuchatel Switzerland

BUDGET SENSORS

Scientific, surveying, optical, and measuring apparatus and instruments, namely, scanning probe microscopes, scanning electron microscopes, and atomic force microscopes; apparatus and instruments for conducting, switching, transforming, accumulating, regulating, or controlling electricity, namely, electric conductors, electric switches, electric transformers, electric accumulators, and electric controllers; microscopes and their parts, namely, sensors and probes and component and replacement and consumable parts thereof for non-optical microscopes, scanning near-field optical microscopes, scanning microscopy, scanning probe microscopy, scanning electron microscopy, and atomic force microscopy; micromechanical and microelectromechanical sensor systems, namely, electric sensors; micromechanical and microelectromechanical instruments and apparatus for detecting surfaces and properties of materials; micromechanical strip and diaphragm sensors; scanning instruments and sensors as well as component and replacement parts thereof for determining and measuring surfaces and properties of materials

Color is not claimed as a feature of the mark.

Scientific apparatus and instruments, namely atomic force microscope probes and scanning probe microscopes; microscope probes; calibration standards, namely devices consisting of a 2-dimensional lattice of inverted square pyramids designed to calibrate atomic force microscopes, scanning probe microscopes and scanning tunneling microscopes; microscopes and microscope probes for use in the field of atomic force microscopy, scanning tunneling microscopy, and near-field optical microscopy; scanning electron microscopes and probes therefore; scanning near field optical microscope and accessories therefore, namely probes and lenses; confocal microscopes and accessories therefore, namely electronic imaging scanners; digital holographic microscopes and accessories therefor, namely objective lenses; scanning tunneling microscopes and tips therefore; interferometers; white light interferometric profilers made of metal, plastic and glass fibers and used to analyze surface topography at the nano scale; electronic mechanical vibration isolation equipment, namely a platform with instruments designed to protect against vibration and measurement distortion caused by noise, air flow, near by streets and movement of people; computer software designed to analyze images in the field of scanning probe microscopy, atomic force microscopy, near-field scanning optical microscopy and scanning tunneling microscopy; image database management software; electrical sound protection systems, namely, acoustic vibration isolation chambers; electrical power supplies; voltage surge suppressors; low pass inductor filters used in high power electrical applications

NANO AND MORE

The mark consists of a ball with an arc crossing the ball and the word HI'RES appearing to the right of the ball.

Sensors and probes for atomic force microscopy, scanning probe microscopy