| TRANSMISSION MAPPER (TMAP) Litel Instruments
76578264 26 Feb 2004 | on 23 Mar 2018 | Combination of a software package and a specialized reticle for use in... Class 009 Class 009 Computer & Software Products & Electrical & Scientific Products Combination of a software package and a specialized reticle for use in determining the state of the lens angular transmittance of an optical projection system | | | DISTORTION MAPPER (DMAP) Litel Instruments
76578263 26 Feb 2004 | on 17 Feb 2017 | optical distortion mapping device comprised of computer software and r... Class 009 Class 009 Computer & Software Products & Electrical & Scientific Products "Distortion Mapper" | | | INSPECSTEP INTERFEROMETER (ISI) Litel Instruments
76574018 16 Jan 2004 | on 10 Feb 2017 | interferometer and a software package for analyzing data received from... Class 009 Class 009 Computer & Software Products & Electrical & Scientific Products INSPECT STEP INTERFEROMETER (ISI) | | | HIGH ACCURACY INSPECSTEP INTERFEROMETER (HA-ISI) Litel Instruments
76597005 14 Jun 2004 | on 10 Feb 2017 | Interferometer and software package for analyzing semiconductor chip o... Class 009 Class 009 Computer & Software Products & Electrical & Scientific Products Interferometer and software package for analyzing semiconductor chip optical test structure data received from an overlay tool, sold as a unit | | | IN-SITU INTERFEROMETER (ISI) Litel Instruments
76574017 16 Jan 2004 | on 03 Feb 2017 | interferometer and a software package for analyzing data received from... Class 009 Class 009 Computer & Software Products & Electrical & Scientific Products "In-Situ Interferometer" | | | HYPER NA ISI Litel Instruments
76667865 23 Oct 2006 | on 31 Oct 2014 | Components of optical instruments for use in the semiconductor industr... Class 009 Class 009 Computer & Software Products & Electrical & Scientific Products HYPER NUMERICAL APERTURES ISI | | | HYPER NA SMI Litel Instruments
76666540 22 Sep 2006 | on 24 Oct 2014 | Components of optical instruments for use in the semiconductor industr... Class 009 Class 009 Computer & Software Products & Electrical & Scientific Products Components of optical instruments for use in the semiconductor industry, namely, apparatus comprised of computer software for use in analyzing data received from an image capture tool and in-situ imaging objectives of the pinhole, refractive or reflective kind, in the same form factor as a standard reticle for use in exposing photographically prepared patterns on projection imaging systems that potentially operate at numerical apertures above one, and images that are used for measuring and aiming to the surfaces of wafers for use in manufacturing of integrated circuits | | | LITEL GPP Litel Instruments
85763425 25 Oct 2012 | on 01 Oct 2013 | Computer software for processing digital images; Vehicle detection equ... Class 009 Class 009 Computer & Software Products & Electrical & Scientific Products Computer software for processing digital images; Vehicle detection equipment, namely, display monitors, computers, image sensors, video cameras, and operating system and application software to detect vehicle location | | | LITEL MAC Litel Instruments
85764559 26 Oct 2012 | on 01 Oct 2013 | Computer hardware and computer software programs for the integration o... Class 009 Class 009 Computer & Software Products & Electrical & Scientific Products Computer hardware and computer software programs for the integration of text, audio, graphics, still images and moving pictures into an interactive delivery for multimedia applications; Computer software for processing digital images; Vehicle detection equipment, namely, display monitors, computers, image sensors, video cameras, and operating system and application software to detect vehicle location | | | HIGH ACCURACY SOURCE METROLOGY INSTRUMENT (HA-SMI). Litel Instruments
76587121 14 Apr 2004 | on 08 Mar 2013 | Components of optical instruments for use in the semiconductor industr... Class 009 Class 009 Computer & Software Products & Electrical & Scientific Products Components of optical instruments for use in the semiconductor industry, namely, apparatus comprised of computer software for use in analyzing data received from an image capture tool and an in-situ imaging objective with mounting means attached to a framework in the same form factor as a standard reticle for use in exposing photographically prepared patterns and images that are used for measuring and aiming to the sufraces of wafers for use in manufacturing of integrated circuits | | 
