About 64 Trademarks found that are owned by Klatencor Corporation

computer hardware and software and equipment consisting of inspection, metrology and testing hardware, all for inspection and testing of semiconductors during manufacturing and processing

Computer hardware; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for providing analytic data on the performance of inspection and metrology tools; cluster tools, namely, electronic apparatus for semiconductor wafer shape metrology and wafer defect inspection

Computer hardware, namely, computerized illumination regulators for magnifying light for use in the testing and inspection of the physical, material and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for providing analytic data on the performance of inspection and metrology tools

Computer hardware, software and user manuals sold as a unit and equipment consisting of inspection, metrology and testing hardware, all for inspection, metrology and testing of materials and surfaces

Computer hardware; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for providing analytic data on the performance of inspection and metrology tools; cluster tools, namely, electronic apparatus for semiconductor wafer shape metrology and wafer defect inspection

Computer hardware; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for providing analytic data on the performance of inspection and metrology tools

Consulting services in the field of product inspection and testing for the semiconductor, integrated circuit and microelectronics manufacturing industries; consulting services in the field of product inspection and testing for the semiconductor, integrated circuit and microelectronics manufacturing industries with respect to yield management; providing technical information in the field of inspection, metrology and testing of the physical and electrical properties of semiconductors, integrated circuits and microelectronics for quality control

Consulting services in the field of product inspection and testing for the semiconductor, integrated circuit and microelectronics manufacturing industries; consulting services in the field of product inspection and testing for the semiconductor, integrated circuit and microelectronics manufacturing industries with respect to yield management; providing technical information in the field of inspection, metrology and testing of the physical and electrical properties of semiconductors, integrated circuits and microelectronics for quality control

Computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for providing analytic data on the performance of inspection and metrology tools

OPTICAL MEASUREMENT SYSTEM COMPRISING A LIGHT SOURCE, A DETECTOR AND A PROCESSOR FOR EVALUATING MICROSCOPIC GEOMETRIC FEATURES ON SEMICONDUCTOR WAFER

Computer hardware; computer hardware, namely, computer equipment for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries, for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics, and computer equipment for providing analytic data on the performance of inspection and metrology tools; cluster tools, namely, electronic apparatus for semiconductor wafer shape metrology and wafer defect inspection