About 101 Trademarks found that are owned by Kla Corporation

SEMICONDUCTOR WAFER RESISTIVITY MAPPING SYSTEM COMPRISED OF SOME OR ALL OF THE FOLLOWING: PROGRAMMABLE COMPUTER, GRAPHICS TERMINAL, GRAPHICS PRINTER, INSTRUMENTATION INTERFACE, AND RESISTIVITY TEST UNITS

AUTONOMOUS SPATIALLY RESOLVED ELECTRONIC OR MECHANICAL SENSORS FOR SEMICONDUCTOR MANUFACTURING APPLICATIONS

NON-CONTACT DIMENSIONAL GAGING APPARATUS

KT DESIGN WORKS

house mark for instruments and systems for the measurement and/or modification of physical, optical and/or electrical properties of objects such as semiconductor wafers, computer disks, tires, precision motion assemblies, machined parts, etc; associated hardware and software for system control, data acquisition, processing, display and communication; associated material handling subsystems and services related to customized design thereof

FLASH SCAN

ULTRA GAGE

scientific instruments, namely, contacting instruments for use in inspection and measurement of sheet resistance of a conducting sample through the use of a contacting probe or pin arrangement; scientific instruments, namely, non-contacting instruments for use in inspection and measurement of sheet resistance of a conducting sample through the use of eddy currents in a non-contacting arrangement

Apparatus and instruments for recording, transmitting, reproducing or processing sound, images or data; recorded and downloadable digital media, namely, pre-recorded dvds, downloadable audio and video recordings, and CDs in the field of surface data analysis, surface visualization, and report generation; downloadable computer software for surface data analysis, namely, 2D and 3D surface data analysis, surface visualization, and report generation; blank digital or analogue recording and storage in the field of surface data analysis, namely, 2D/3D surface data analysis, surface visualization, report generation; Calculating devices, namely, calculators; Computers; Computer peripheral devices; Scaling and measuring instruments, namely, surface roughness testing machines and instruments, namely, profilometers and profilers; Measuring apparatus and measuring instruments, namely, stylus profilometers and stylus profilers for use in identifying and measuring physical and surface topography properties and for use in research and development regarding same; Electronic and optical instruments for measuring surfaces and for use in research and development regarding same; Surface roughness testing machines and instruments; Instruments for testing and inspecting physical and electrical properties of semiconductors, compound semiconductor, solar components, light emitting diodes, micro-electro-mechanical systems, medical devices, automotive components and data storage and for use in research and development regarding same; Computer hardware and downloadable software used for testing and inspecting physical and electrical properties of semiconductors, compound semiconductor, solar components, Light emitting diodes, Micro-electro-mechanical systems, medical devices, automotive components and data storage and for use in research and development regarding same

FILM MEASURE