About 1 Trademarks found that are owned by Kabushiki Kaisha Yokowo Also Trading As Yokowo Co Ltd

Semiconductor testing apparatus; testing apparatus for testing printed circuit boards; testing apparatus for testing printed boards; testing apparatus for testing component mounting boards; testing apparatus for testing integrated circuits; measuring apparatus in the nature of jigs for machines for measuring electricity or signals; probes for scientific purposes; computer component testing and calibrating equipment; probes for testing printed circuit boards; test adapters for testing printed circuit boards; testing apparatus for testing printed circuit boards and structural parts thereof; probes for testing printed boards; testing apparatus for testing printed boards and structural parts thereof; probes for testing component mounting boards; testing apparatus for testing component mounting boards and structural parts thereof; testing apparatus for testing integrated circuits and structural parts thereof; probes for testing integrated circuits; probes for electrical testing of circuit boards; probe for electric loss measurement instrument