About 4 Trademarks found that are owned by Jpk Instruments Ag

Analysis apparatus in the nature of sample testing instruments, namely, precision laser measuring apparatus, microscopes, scanning probe microscopes, spectrometers; computer operating programs; computer software for use in data processing; and data processors

[ Treatment of materials by laser beam and scanning probe microscopes ]

Scanning probe microscopes for analyzing sample surfaces on the nanometer scale by using a very sharp tip

The mark is written without space between "Cell" and "Hesion"; only the C in the beginning of "Cell" and the H in the beginning of Hesion are written in capital letters.

Microscopes, namely Scanning Probe Microscopes and Atomic Force Microscopes for analyzing and manipulating surfaces at the nanometer scale by means of a atomically fine tip, that scans over the surface of a sample