| ALPHA-SE J.A. WOOLLAM CO. INC.
76577960 23 Feb 2004 | on 23 Sep 2024
| EQUIPMENT, NAMELY ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS... Class 009 Class 009 Computer & Software Products & Electrical & Scientific Products EQUIPMENT, NAMELY ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR, DISK DRIVE, MAGNETIC DATA STORAGE MEDIA, OPTICAL DATA STORAGE MEDIA, THIN FILMS AND MULTIPLE LAYER FILMS ON SUBSTRATES AND COATINGS, AND COMPUTER PROGRAMS NECESSARY FOR CONTROLLING THE ELLIPSOMETER BASED APPARATUS AND FOR ANALYZING ACQUIRED ELLIPSOMETRIC DATA | | | AUTORETARDER J.A. WOOLLAM CO., INC.
76711308 23 Apr 2012 | on 17 Aug 2022
| ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPE... Class 009 Class 009 Computer & Software Products & Electrical & Scientific Products ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR, DISK DRIVE, MAGNETIC DATA STORAGE MEDIA, OPTICAL DATA STORAGE MEDIA, THIN FILMS AND MULTIPLE LAYER FILMS ON SUBSTRATES AND COATINGS, AND COMPUTER PROGRAMS NECESSARY FOR CONTROLLING THE ELLIPSOMETER BASED APPARATUS AND FOR ANALYZING ACQUIRED ELLIPSOMETER DATA | | | THZ-VASE J.A. WOOLLAM CO., INC.
76707791 31 May 2011 | on 09 Nov 2021
| equipment, namely, ellipsometer based apparatus for measuring thicknes... Class 009 Class 009 Computer & Software Products & Electrical & Scientific Products equipment, namely, ellipsometer based apparatus for measuring thickness, temperature caused effects, and optical properties of semiconductors, disk drives, magnetic data storage media, optical data storage media, thin films, multiple layer films and coatings on substrates, and computer programs necessary for controlling the ellipsometer based apparatus and for analyzing acquired ellipsometric data | | | J.A. WOOLLAM CO. J.A. WOOLLAM CO., INC.
76708405 19 Jul 2011 | on 27 May 2021
| technical services performed in the field of design of ellipsometers, ... Class 042 Class 042 Computer & Software Services & Scientific Services The name "J.A. WOOLLAM" identifies a living individual whose consent is of record. | | | VUV-VASE J.A. WOOLLAM CO. INC.
76107360 11 Aug 2000 | on 20 May 2021
| ELLIPSOMETERS, POLARIMETERS AND SPECTROPHOTOMETERS WHICH UTILIZE ELECT... Class 009 Class 009 Computer & Software Products & Electrical & Scientific Products ELLIPSOMETERS, POLARIMETERS AND SPECTROPHOTOMETERS WHICH UTILIZE ELECTROMAGNETIC RADIATION TO INVESTIGATE SAMPLES IN VACUUM | | | T-SOLAR J.A. WOOLLAM CO., INC.
76703770 12 Jul 2010 | on 23 Jul 2020
| Ellipsometers, polarimeters and reflectometers which utilize electroma... Class 009 Class 009 Computer & Software Products & Electrical & Scientific Products Ellipsometers, polarimeters and reflectometers which utilize electromagnetic radiation for investigating samples consisting of substrates having rough or textured surfaces with or without surface layers | | | VASE J.A. WOOLLAM CO. INC.
75889201 06 Jan 2000 | on 03 Apr 2020
| ELLIPSOMETERS, POLARIMETERS AND SPECTROPHOTOMETERS WHICH UTILIZE ELECT... Class 009 Class 009 Computer & Software Products & Electrical & Scientific Products ELLIPSOMETERS, POLARIMETERS AND SPECTROPHOTOMETERS WHICH UTILIZE ELECTROMAGNETIC RADIATION TO INVESTIGATE SAMPLES | | | E J.A. WOOLLAM CO. INC.
75889200 06 Jan 2000 | on 03 Apr 2020
| ELLIPSOMETERS, POLARIMETERS AND SPECTROPHOTOMETERS WHICH UTILIZE ELECT... Class 009 Class 009 Computer & Software Products & Electrical & Scientific Products ELLIPSOMETERS, POLARIMETERS AND SPECTROPHOTOMETERS WHICH UTILIZE ELECTROMAGNETIC RADIATION TO INVESTIGATE SAMPLES | | | THETA-SE J.A. WOOLLAM CO., INC.
76720671 09 Apr 2019 | on 28 Jan 2020
| IDENTIFIES EQUIPMENT, NAMELY, ELLIPSOMETER BASED APPARATUS FOR MEASURI... Class 009 Class 009 Computer & Software Products & Electrical & Scientific Products IDENTIFIES EQUIPMENT, NAMELY, ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR, DISK DRIVE, MAGNETIC DATA STORAGE MEDIA, OPTICAL DATA STORAGE MEDIA, THIN FILMS AND MULTIPLE LAYER FILMS ON SUBSTRATES AND COATINGS, AND COMPUTER PROGRAMS NECESSARY FOR CONTROLLING THE ELLIPSOMETER BASED APPARATUS AND FOR ANALYZING ACQUIRED ELLIPSOMETRIC DATA | | | WOOLLAM J.A. WOOLLAM CO., INC.
76715843 18 Feb 2014 | on 04 Dec 2019
| LABORATORY RESEARCH, NAMELY, INVESTIGATING SAMPLES WITH AND WITHOUT SU... Class 042 Class 042 Computer & Software Services & Scientific Services LABORATORY RESEARCH, NAMELY, INVESTIGATING SAMPLES WITH AND WITHOUT SURFACE LAYERS BY USING ELLIPSOKETERS, POLARIMETERS AND REFLECTOMETERS WHICH UTILIZE ELECTOMAGNETIC RADIATION | | 
