About 30 Trademarks found that are owned by Helmut Fischer Gmbh Institut Fur Elektronik Und Messtechnik

Electronic Meters for Measuring the Ferrite Content of Austenitic Steel

Scientific, electrical, optical, monitoring and measuring instruments, namely, instruments for measuring the thickness of layers, in particular by eddy current, [ electromagnetic radiation, magnetic induction and/or coulometric methods, ] instruments for measuring thickness of coatings, alloy composition, material analysis, [ porosity, electrical conductivity, ferrite content, microhardness, ] phase angles, and other properties of coatings and layers; [ magneto-, opto-electronic data recording media, namely, blank magnetic computer tapes and floppy discs; ] data processors; computers; computer software for use in controlling scientific, electrical, optical, and monitoring parameters of measuring instruments and to analyze and evaluate, transmit and process the results

Scientific, electrical, optical, monitoring and measuring instruments, namely, instruments for measuring the thickness of layers by electromagnetic radiation, optical instruments for measuring the diffraction, refraction, absorption, luminescence, scattering, and reflection phenomena for the determination of layer thickness, coating thickness measurement instruments, [ electrical conductivity measurement instrument, micro hardness measuring instruments, porosity measuring instruments, ] instruments for measuring thickness of coatings, alloy composition, material analysis, [ porosity, electrical conductivity, ferrite content, microhardness, and other properties of coatings and layers; magneto-, opto-electronic data recording media, namely, blank magnetic computer tapes and floppy discs; ] electromagnetic radiation detectors; spectrometers, namely, X-ray fluorescence spectrometers; semiconductors detectors, color video cameras, X-ray detectors; X-ray tubes for scientific laboratory purposes, data processors; computers; computer software for use in controlling the scientific, electrical, optical, and monitoring parameters of measuring instruments and to analysis and evaluate, transmit and process the results

Color is not claimed as a feature of the mark.

[ training in the use and operation of scientific, electrical, optical monitoring and measuring instruments and computers and software used therein, providing on-line training via a global computer network in the use an operation of scientific, electrical, optical monitoring and measuring instruments and computers and software used therein ]

Scientific, electrical, optical monitoring and measuring instruments, namely, coating thickness measurement instruments, [ electrical conductivity measurement instruments, microhardness measuring instruments, porosity measuring instruments; ] instruments for measuring thickness of coatings, alloy compositions, material analysis, [ porosity, electrical conductivity, ] ferrite content, [ micro-hardness, ] and other properties of coatings and layers; [ magneto,- opto,- and electronic data recording media, namely, blank magnetic computer tapes and floppy discs; ] computers and data processors for use in the aforementioned scientific, electrical, optical monitoring and measuring instruments; thickness measurement instruments that use [ ultra sound and ]electromagnetic radiation for measurement of diffraction, refraction, absorption, luminescence, scattering and reflection phenomena to determine the layer thicknesses of metal for measurement; x-ray detectors; x-ray tubes not for medical purposes; computer software for use in the aforementioned scientific, electrical, optical monitoring and measuring instruments

Instruments for Measuring the Thickness of Non-Conductive and Non-Magnetic Metal Coatings on Substrates

Scientific, electrical, optical, monitoring and measuring instruments, namely, instruments for measuring thickness of coatings, alloy composition, material analysis, [ porosity, electrical conductivity, ferrite content, micro-hardness, ] and other properties of coatings and layers; computers and data processors for use in the aforementioned measuring instruments; [ blank magnetic computer tapes and floppy disks for recording magnetic, optical and electronic data; ] thickness measurement instruments that use [ ultra sound and ] electromagnetic radiation for measurement of diffraction, refraction, absorption, luminescence, scattering and for reflection phenomena to determine the layer of thickness of metal, x-ray detectors; x-ray tubes not for medical purposes; computer software for use in controlling scientific, electrical, optical and monitoring parameters of measuring instruments and to analyze and evaluate, transmit and process data

Scientific, electrical, optical, monitoring and measuring instruments, namely, instruments for measuring thinkness of coatings, alloy composition, material analysis, [ porosity, electrical conductivity, ] content, [ micro-hardness, ] and other properties of coatings and layers; computer and data processors for use in the aforementioned measuring instruments; [ blank magnetic computer tapes and floppy disks for recording magnetic, optical and electronic data; ] thickness measurement instruments that use [ ultra sound and ] electromagnetic radiation for measurement of diffraction, refraction, absorption, luminescence, scattering and reflection phenomena to determine to layer of thickness of metal x-ray detectors; x-ray tubes not for medical purposes; computer software for use in controlling scientific, electrical, optical and monitoring parameters of measuring instruments and to analyze and evaluate, transmit and process data

The mark consists of stylized letters FI in triangular form laid upon the design representation of a globe.

Programmable Testing and Measuring Instruments-Namely, Electronic Instruments for Non-Destructive Measurement of Layer Thickness, and Non-Destructive Conductivity Measuring Instruments; Electronic Revolution Meters; Cutting Force Meters; Instruments for Measuring the Density of Anodized Aluminum Coatings

Measuring the Conductivity of Nonmagnetic Layers or Metals in the Range of 10 to 2000 Micrometers

Electronic Measuring Instruments for Measuring the Thickness of Layers in the Range of 1 Micron to 1,000 Microns