About 3 Trademarks found that are owned by Coxem Co Ltd

Electron microscope; Electron microscope that can obtain images of sample located at atmospheric pressure or low vacuum; Thin membrane used for an electron microscope to separate an inner vacuum space of the electron microscope from an outer atmosphere space in which a sample is placed; Electron microscope parts; Device for Energy Dispersive X-ray Spectroscopy (EDS device); Cross sectional polisher using ion beam for polishing a cross section of, for example, a specimen used for an electron microscope; Particle analysis device using an electron mocroscope and an EDS device; Computer central processing units for processing information, data, sound or images; Computer operating programs, recorded; Computer software for artificial intelligence

Electron microscope; Electron microscope that can obtain images of sample located at atmospheric pressure or low vacuum; Thin membrane used for an electron microscope to separate an inner vacuum space of the electron microscope from an outer atmosphere space in which a sample is placed; Electron microscope parts; Device for Energy Dispersive X-ray Spectroscopy (EDS device); Cross sectional polisher using ion beam for polishing a cross section of, for example, a specimen used for an electron microscope; Particle analysis device using an electron mocroscope and an EDS device; Computer central processing units for processing information, data, sound or images; Computer operating programs, recorded; Computer software for artificial intelligence

The mark consists of the black wording "CO" and "EM" and the green letter "X" between "CO" and "EM". The color white is not claimed as a feature of the mark and merely represents background or transparent areas.

Electron microscope; Electron Microscope parts; Electron tubes; Device for Energy Dispersive X-ray Spectroscopy, namely, photo electron spectroscopy analyzers, not for medical purposes; cross sectional polisher using ion beam, namely, ion miller for polishing a cross section of a specimen used for an electron microscope; Electron capture detectors; X-ray apparatus, not for medical purposes; Ion Sputter Coater being a coating device using ion for a specimen of an electron microscope; Computer Central processing units for processing information, data, sound or images; Computer operating programs, recorded