About 86 Trademarks found that are owned by Bruker Nano Inc.

Metrology instruments, namely, scanning probe microscopes (SPMs) and atomic force microscopes (AFMs)

ANALYTICAL INSTRUMENTATION, NAMELY, ATOMIC FORCE MICROSCOPE FOR THE DETECTION AND MEASUREMENT OF MINUTE INTERACTIONS, SUCH AS THOSE THAT OCCUR BETWEEN BIOLOGICAL MOLECULES

handheld tool used to explore tip-sample interactions manually, relative to force spectroscopy research

SCIENTIFIC AND TECHNOLOGICAL RESEARCH AND DEVELOPMENT OF PRODUCTS FOR OTHERS, NAMELY ATOMIC FORCE MICROSCOPES AND SCANNING TUNNELING MICROSCOPES, IN THE FIELD OF METROLOGY

Hardware and software for enhancing high performance of nanoscale metrology tools

Metrology instruments, namely, scanning probe microscopes (SPM), namely, atomic force microscopes (AFM)