About 86 Trademarks found that are owned by Bruker Nano Inc.

AUTO METROLOGY

Surface measurement equipment comprised of stylus based surface profilers, and probes and computer software therefor

PROBE BASED TOOL USED TO CREATE IMAGES OF SUBMICRON SCALE FEATURES, NAMELY TOPOGRAPHICAL, PHYSICAL, CHEMICAL, ELECTRICAL, AND MAGNETIC PROPERTIES OF MATERIALS

surface measurement instrumentation, namely stylus based surface profilers, four-point resistivity probes, atomic force profilers, and atomic force microscopes

"3D ULTRA"

FAST SCAN

Equipment, namely off-the-shelf components and proprietary software used for the manipulation of small quantities of materials, such as individual atoms, using scanning probe microscopy and types of advanced microscopy

Tribology and micromechanical testing instruments, namely, tribometers and mechanical testers in the nature of macro-, micro- and nanomechanical testing instruments for conducting friction and wear testing as well as compression, tensile, torsional, indentation, lateral force, scratch, and fatigue testing, and data acquisition in ambient and controlled low and high temperature environments and under vacuum

Probe-based instruments, namely, scanning probe microscopes and atomic force microscopes; Software for operating probe-based instruments

Metrology instruments, namely, scanning probe microscopes (SPMs) and atomic force microscopes (AFMs)