About 42 Trademarks found that are owned by Ade Corporation

System comprising computer hardware and software for measuring substrate characteristics, namely, for measuring semiconductor wafer characteristics

Software for semiconductor wafer test data analysis

Substrate inspection system, comprising non contact optical scanning equipment and associated software for inspecting semiconductor wafers and for detecting and classifying surface defects on wafers, namely, particles and scratches, polishing defects, crystal orientation defects, roughness, edge chips and cracks

Substrate inspection systems, comprising computer hardware and associated software for measurement of substrates, namely, semiconductor wafers, to determine wafer flatness, shape, thickness Bow Wrap and SORI, resistivity, conductivity and notch detection

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Software for use in measuring and analyzing stress values for substrates, particularly semiconductor wafers

Software for use in measuring thickness of substrates, particularly semiconductor wafers, and more particularly backgrind characterization, film thickness, measurement and shape differencing

signal processors, namely computer implemented signal processors for measuring or characterizing semiconductor wafers, computer disks, tires, precision motion assemblies and machine parts