on 09 Apr 2024
Last Applicant/ Owned by
2-10-1 Shin-yokohama, 2
JP
Serial Number
79357009 filed on 20th Sep 2022
Registration Number
7349517 registered on 09th Apr 2024
Filing Basis
1. filing basis filed as 66 a
Disclaimer
NO DATA
Optical inspection apparatus for semi-conductor materials and elements; confocal microscopes; semi-conductor testing machines and instruments; electron microscopes; differential interferometry detectors; testing apparatus not for medical purposes, namely, semiconductor testing apparatus; precision differential Interferometric measuring apparatus; data sets, downloadable, in the field of semiconduc Read More
Optical inspection apparatus for semi-conductor materials and elements; confocal microscopes; semi-conductor testing machines and instruments; electron microscopes; differential interferometry detectors; testing apparatus not for medical purposes, namely, semiconductor testing apparatus; precision differential Interferometric measuring apparatus; data sets, downloadable, in the field of semiconductors; computer software, recorded, for controlling confocal microscopes; computer software applications, downloadable, for operating confocal microscopes; computer hardware; computer programs, downloadable, for recording images from confocal microscopes
N/A
N/A
No 79357009
No Service/Collective Mark
No TM230105USIP
No
No
No
No
Yes
Yes
No
No
Status Date | Action Taken |
---|---|
19th Oct 2024 | FINAL DISPOSITION NOTICE CREATED, TO BE SENT TO IB |
09th Apr 2024 | NOTICE OF REGISTRATION CONFIRMATION EMAILED |
09th Apr 2024 | REGISTERED-PRINCIPAL REGISTER |
14th Feb 2024 | NOTIFICATION PROCESSED BY IB |
03rd Feb 2024 | NEW REPRESENTATIVE AT IB RECEIVED |
23rd Jan 2024 | OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED |
23rd Jan 2024 | PUBLISHED FOR OPPOSITION |
03rd Jan 2024 | NOTIFICATION OF POSSIBLE OPPOSITION SENT TO IB |
03rd Jan 2024 | NOTICE OF START OF OPPOSITION PERIOD CREATED, TO BE SENT TO IB |
03rd Jan 2024 | NOTIFICATION OF NOTICE OF PUBLICATION E-MAILED |