CANCELLED - SECTION 8
section 8
on 09 Sep 2011
Last Applicant/ Owned by
4150 Freidrich Lane, Suite A
Austin
TX
78744
Serial Number
76182067 filed on 14th Dec 2000
Registration Number
2925556 registered on 08th Feb 2005
Filing Basis
1. intent to use
2. use application currently
Disclaimer
NO DATA
NLINE
Custom manufacture and design of inspection and test equipment for the semiconductor industry, namely, wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical d Read More
Classification Information
Class [009]
Computer & Software Products & Electrical & Scientific Products
Inspection and test equipment for the semiconductor industry, namely, wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical dimension measurement equipment, and microscopes, for use in the manufacturing and testing of semiconductors
First Use Date in General
01st Jul 2000
First Use Date in Commerce
01st Jul 2000
Class [037]
Construction and Repair Services
Installation, maintenance and repair of inspection and test equipment for the semiconductor industry, namely, wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical dimension measurement equipment, and microscopes
First Use Date in General
01st Jul 2000
First Use Date in Commerce
01st Jul 2000
Class [040]
Treatment & Processing of Materials Services
Custom manufacture and design of inspection and test equipment for the semiconductor industry, namely, wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical dimension measurement equipment, and microscopes
First Use Date in General
01st Jul 2000
First Use Date in Commerce
01st Jul 2000
Class [042]
Computer & Software Services & Scientific Services
On-site and off-site inspection services for the semiconductor industry, namely wafer inspection, reticle inspection, defect detection, defect review, defect classification, nanotopography measurement, wafer flatness measurement, surface profiling, film thickness measurement, critical dimension measurement, and microscopy; and leasing and consultation of inspection and test equipment for the semiconductor industry, namely wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical dimension measurement equipment, and microscopes
First Use Date in General
01st Jul 2000
First Use Date in Commerce
01st Jul 2000
Mark Details
Serial Number
No 76182067
Mark Type
No Service Mark
Attorney Docket Number
No 068062.0105
44D Filed
No
44D Current
No
44E filed
No
44E Current
No
66A Filed
No
66A Current
No
Current Basis
No
No Basis
No
Legal History
| Status Date | Action Taken |
|---|---|
| 09th Sep 2011 | CANCELLED SEC. 8 (6-YR) |
| 08th Feb 2005 | REGISTERED-PRINCIPAL REGISTER |
| 10th Dec 2004 | LAW OFFICE REGISTRATION REVIEW COMPLETED |
| 06th Dec 2004 | ASSIGNED TO LIE |
| 28th Nov 2004 | ALLOWED PRINCIPAL REGISTER - SOU ACCEPTED |
| 08th Nov 2004 | STATEMENT OF USE PROCESSING COMPLETE |
| 15th Oct 2004 | USE AMENDMENT FILED |
| 15th Oct 2004 | PAPER RECEIVED |
| 31st Aug 2004 | CASE FILE IN TICRS |
| 11th May 2004 | FAX RECEIVED |