SECTION 8 & 15-ACCEPTED AND ACKNOWLEDGED
accepted and acknowledged
on 29 Dec 2021
Last Applicant/ Owned by
KOHOUTOVICE,
BRNO
CZ
62300
Serial Number
86292505 filed on 27th May 2014
Registration Number
4810983 registered on 15th Sep 2015
Correspondent Address
Joe McKinney Muncy
Filing Basis
1. filed as use application
2. use application currently
Disclaimer
NO DATA
Logo Mark Trademark Information
Installation, maintenance and repair of microscopes, namely, electron microscopes, scanning electron microscopes, transmission electron microscopes, ion microscopes, Raman microscopes, atomic force microscopes, holographic microscopes; installation, maintenance and repair of scientific apparatus, namely, electron sources for microscopes, ion sources for microscopes in the nature of liquid-metal io Read More
Classification Information
Class [041]
Education and Entertainment Services
Arranging and conducting conferences, colloquiums, congresses, courses, seminars, symposiums, and workshops all for training purposes in the field of microscopy and nanotechnology, specifically in the subject areas of scanning and transmission electron microscopy, ion beam microscopy, ion beam processing techniques, and complex methods combining the forgoing microscopy with Raman microscopy, atomic force microscopy and lasers, and holographic microscopy
First Use Date in General
31st Oct 2013
First Use Date in Commerce
31st Oct 2013
Class [037]
Construction and Repair Services
Installation, maintenance and repair of microscopes, namely, electron microscopes, scanning electron microscopes, transmission electron microscopes, ion microscopes, Raman microscopes, atomic force microscopes, holographic microscopes; installation, maintenance and repair of scientific apparatus, namely, electron sources for microscopes, ion sources for microscopes in the nature of liquid-metal ion sources, and plasma sources; installation, maintenance and repair of focused ion beam tools and electron beam tools, namely, instruments for material deposition and removal and instruments for imaging, analysis, and measurement of materials in the fields of microscopy and nanotechnology; installation, maintenance and repair of electron-beam lithography apparatus; installation, maintenance and repair of particle analyzers and classification instruments in the field of mineralogy; installation, maintenance and repair of spectrometry systems, namely, time-of-flight secondary ion mass spectrometry systems, X-ray and visible light spectrometry systems; installation, maintenance and repair of lasers for non-medical purposes; installation, maintenance and repair of optical apparatus and instruments, namely, optical prisms, optical lenses, optical fibres, optical cables, optical mirrors; installation, maintenance and repair of diaphragms for scientific apparatus; installation, maintenance and repair of measuring instruments, namely, micrometer gauges; installation, maintenance and repair of detectors for electron and ion beam systems, electron detectors, secondary ions detectors, back scattered electron detectors, X-ray detectors, and cathodoluminiscence detectors; installation, maintenance and repair of diffraction apparatus and diffraction detectors for microscopes, electron multiplier tubes, photo multipliers, amplifiers, gas injection systems, electron flood guns, stages and nanomanipulators for microscopes, decontaminators, vacuum systems and gauges
First Use Date in General
31st Oct 2013
First Use Date in Commerce
31st Oct 2013
Class [009]
Computer & Software Products & Electrical & Scientific Products
Microscopes, namely, electron microscopes, scanning electron microscopes, transmission electron microscopes, ion microscopes, Raman microscopes, atomic force microscopes, holographic microscopes; scientific apparatus, namely, electron sources for microscopes; scientific apparatus in the nature of ion sources for microscopes, namely, liquid-metal ion sources and plasma sources; focused ion beam tools and electron beam tools, namely, instruments for material deposition and removal and for imaging, analysis, and measurement of materials in the fields of microscopy and nanotechnology; optical apparatus, namely, electron-beam lithography device; scientific instruments, namely, particle analyzers and classification instruments in the field of mineralogy; spectrometry scientific apparatus and instruments, namely, time-of-flight secondary ion mass spectrometry systems, X-ray and visible light spectrometry systems; lasers for non-medical purposes; optical apparatus and instruments, namely, optical prisms, optical lenses, optical fibres, optical cables, optical mirrors; diaphragms for scientific apparatus; measuring instruments, namely, micrometer gauges; parts and fittings for all the aforesaid goods, namely, electron and ion detectors for electron and ion beam systems, electron detectors, secondary ions detectors, back scattered electron detectors, X-ray detectors, cathodoluminiscence detectors; parts and fittings for all the aforesaid scientific instruments, namely, diffraction apparatus and diffraction detectors for microscopes, electron multiplier tubes, photo multipliers, amplifiers, gas injection systems, electron flood guns, stages and nanomanipulators for microscopes, decontaminators, vacuum systems and gauges; microscopic system navigational software, namely, microscope software that enhances the navigational and functional capability of microscopic, analytic, lithographic and spectroscopic components separately and in integrated systems; application software and operation system software for operation of all the foregoing equipment separately and in integrated systems, namely, operating software for use in microscopic imaging, milling, deposition and analysis; image processing software
First Use Date in General
31st Oct 2013
First Use Date in Commerce
31st Oct 2013
Mark Details
Serial Number
No 86292505
Mark Type
No Service Mark
Attorney Docket Number
No XZ210600030
44D Filed
No
44D Current
No
44E filed
No
44E Current
No
66A Filed
No
66A Current
No
Current Basis
No
No Basis
No
Design Code(s)
01.15.25 -
Other natural phenomena and observable events
26.05.21 -
Triangles that are completely or partially shaded
26.11.21 -
Rectangles that are completely or partially shaded
Legal History
| Status Date | Action Taken |
|---|---|
| 15th Sep 2024 | COURTESY REMINDER - SEC. 8 (10-YR)/SEC. 9 E-MAILED |
| 01st Nov 2023 | AUTOMATIC UPDATE OF ASSIGNMENT OF OWNERSHIP |
| 29th Dec 2021 | NOTICE OF ACCEPTANCE OF SEC. 8 & 15 - E-MAILED |
| 29th Dec 2021 | REGISTERED - SEC. 8 (6-YR) ACCEPTED & SEC. 15 ACK. |
| 12th Oct 2021 | CASE ASSIGNED TO POST REGISTRATION PARALEGAL |
| 01st Jul 2021 | TEAS SECTION 8 & 15 RECEIVED |
| 23rd Jun 2021 | APPLICANT/CORRESPONDENCE CHANGES (NON-RESPONSIVE) ENTERED |
| 23rd Jun 2021 | TEAS WITHDRAWAL OF ATTORNEY RECEIVED-FIRM RETAINS |
| 23rd Jun 2021 | TEAS CHANGE OF CORRESPONDENCE RECEIVED |
| 23rd Jun 2021 | TEAS CHANGE OF DOMESTIC REPRESENTATIVES ADDRESS |