ABANDONED - FAILURE TO RESPOND OR LATE RESPONSE
failure to respond or late response
on 28 Oct 2024
Last Applicant/ Owned by
82024 Taufkirchen
DE
Serial Number
79379510 filed on 24th Jul 2023
Registration Number
N/A
Correspondent Address
13355 Berlin,
GERMANY
Filing Basis
1. filing basis filed as 66 a
Disclaimer
NO DATA
INSPEC
Materials testing and analysing; calibration services relating to analytical apparatus; installation, maintenance, updating and upgrading of computer software the aforementioned services for patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the field Read More
Classification Information
Class [042]
Computer & Software Services & Scientific Services
Materials testing and analysing; calibration services relating to analytical apparatus; installation, maintenance, updating and upgrading of computer software the aforementioned services for patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; installation, maintenance and updating of computer software the aforementioned services for patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; software as a service [SaaS] for patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; design, development and programming of computer software the aforementioned services for patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; design and development of computer software for process control in the fields of micro- and nanoscale science and technology; software design for others for patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; calibration of processes
First Use Date in General
N/A
First Use Date in Commerce
N/A
Class [009]
Computer & Software Products & Electrical & Scientific Products
Downloadable computer software for remote monitoring and analysis for use in patterning, processing in the fields of micro and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; software for monitoring, analysing, controlling and running physical world operations all in the fields of micro- and nanoscale science and technology; computer software for use in remote meter monitoring; measuring, detecting, monitoring and controlling devices; scanning electron microscopes; scanning probe microscopes; apparatus and instruments for scanning probe microscopy; metering software, recognition software, monitoring software, control software, the aforementioned goods for use in patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; software, for use in the following fields: metrology; software, for use in the following fields: control of micro structuring and nano structuring systems; software, for use in the following fields: control of lithography systems; software, for use in the following fields: classification in the fields of micro- and nanoscale science and technology; software, for use in the following fields: detection of defects; software, for use in the following fields: process control in the fields of micro- and nanoscale science and technology; software, for use in the following fields: process monitoring in the fields of micro- and nanoscale science and technology; microscopy software; software, for use in relation to the following goods: scanning electron microscopes; software, for use in the following fields: surface structuring; software, for use in the following fields: surface analysis; software, for use in the following fields: material analyzes; automation software for use in patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; simulation software for use in patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection; software, for use in the following fields: monte carlo simulations; simulation software, for use in the following fields: material analyzes; simulation software, for use in the following fields: surface analysis; simulation software, for use in the following fields: scanning electron microscopes; calibration software; measuring sensors; computer hardware for use in patterning, processing in the fields of micro- and nanoscale science and technology, manufacturing in the fields of micro- and nanoscale science and technology, lithography, microscopy, simulation in the fields of micro- and nanoscale science and technology, classification in the fields of micro- and nanoscale science and technology, metrology, inspection, and defect detection
First Use Date in General
N/A
First Use Date in Commerce
N/A
Mark Details
Serial Number
No 79379510
Mark Type
No Service Mark
Attorney Docket Number
No
44D Filed
No
44D Current
No
44E filed
No
44E Current
No
66A Filed
Yes
66A Current
Yes
Current Basis
No
No Basis
No
Legal History
| Status Date | Action Taken |
|---|---|
| 28th Oct 2024 | ABANDONMENT NOTICE MAILED - FAILURE TO RESPOND |
| 28th Oct 2024 | ABANDONMENT - FAILURE TO RESPOND OR LATE RESPONSE |
| 08th May 2024 | REFUSAL PROCESSED BY IB |
| 15th Apr 2024 | NON-FINAL ACTION MAILED - REFUSAL SENT TO IB |
| 15th Apr 2024 | REFUSAL PROCESSED BY MPU |
| 28th Mar 2024 | NON-FINAL ACTION (IB REFUSAL) PREPARED FOR REVIEW |
| 27th Mar 2024 | NON-FINAL ACTION WRITTEN |
| 27th Mar 2024 | LETTER OF PROTEST EVIDENCE REVIEWED-NO FURTHER ACTION TAKEN |
| 27th Mar 2024 | ASSIGNED TO EXAMINER |
| 09th Dec 2023 | LETTER OF PROTEST EVIDENCE FORWARDED |