CANCELLED - SECTION 8
section 8
on 27 Aug 2010
Last Applicant/ Owned by
4150 Freidrich Lane, Suite A
Austin
TX
78744
Serial Number
76347903 filed on 11th Dec 2001
Registration Number
2807148 registered on 20th Jan 2004
Correspondent Address
Pamela S. Ratliff
Filing Basis
1. intent to use
2. use application currently
Disclaimer
NO DATA
FATHOM
Custom manufacture of inspection and test equipment for the semiconductor industry, namely, wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical dimension me Read More
Classification Information
Class [009]
Computer & Software Products & Electrical & Scientific Products
Inspection and test equipment for the semiconductor industry, namely, wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical dimension measurement equipment, and microscopes, for use in the manufacturing and testing of semiconductors
First Use Date in General
03rd Jul 2002
First Use Date in Commerce
03rd Jul 2002
Class [037]
Construction and Repair Services
Installation, maintenance and repair of inspection and test equipment for the semiconductor industry, namely, wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical dimension measurement equipment, and microscopes
First Use Date in General
03rd Jul 2002
First Use Date in Commerce
03rd Jul 2002
Class [040]
Treatment & Processing of Materials Services
Custom manufacture of inspection and test equipment for the semiconductor industry, namely, wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical dimension measurement equipment, and microscopes
First Use Date in General
03rd Jul 2002
First Use Date in Commerce
03rd Jul 2002
Class [042]
Computer & Software Services & Scientific Services
On-site and off-site inspection services for the semiconductor industry, namely wafer inspection, reticle inspection, defect detection, defect review, defect classification, nanotopography measurement, wafer flatness measurement, surface profiling, film thickness measurement, critical dimension measurement, and microscopy; and leasing and consultation of inspection and test equipment for the semiconductor industry, namely wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical dimension measurement equipment, and microscopes; design of inspection and test equipment for the semiconductor industry, namely, wafer inspection equipment, reticle inspection equipment, defect detection equipment, defect review equipment, defect classification equipment, nanotopography measurement equipment, wafer flatness measurement equipment, surface profiling equipment, film thickness measurement equipment, critical dimension measurement equipment, and microscopes
First Use Date in General
03rd Jul 2002
First Use Date in Commerce
03rd Jul 2002
Mark Details
Serial Number
No 76347903
Mark Type
No Service Mark
Attorney Docket Number
No 068062.0146
44D Filed
No
44D Current
No
44E filed
No
44E Current
No
66A Filed
No
66A Current
No
Current Basis
No
No Basis
No
Legal History
| Status Date | Action Taken |
|---|---|
| 27th Aug 2010 | CANCELLED SEC. 8 (6-YR) |
| 20th Jan 2004 | REGISTERED-PRINCIPAL REGISTER |
| 26th Nov 2003 | ALLOWED PRINCIPAL REGISTER - SOU ACCEPTED |
| 24th Nov 2003 | ASSIGNED TO EXAMINER |
| 21st Nov 2003 | CASE FILE IN TICRS |
| 10th Nov 2003 | STATEMENT OF USE PROCESSING COMPLETE |
| 06th Nov 2003 | EXTENSION 1 GRANTED |
| 06th Oct 2003 | USE AMENDMENT FILED |
| 06th Oct 2003 | EXTENSION 1 FILED |
| 06th Oct 2003 | PAPER RECEIVED |