REGISTERED AND RENEWED
on 19 Mar 2018
Last Applicant/ Owned by
7-6, 3-chome, motoyokoyama-machi
Hachiouji-city, Tokyo
JP
192-0063
Serial Number
78699264 filed on 24th Aug 2005
Registration Number
3455323 registered on 24th Jun 2008
Correspondent Address
Rebeccah Gan
Filing Basis
1. intent to use
2. use application currently
Disclaimer
NO DATA
ELIONIX
Microscope; surface roughness analyzer; electron beam lithography machine; electron probe micro analyzer; ion beam etching machine; plasma etching and deposition machine; indentation tester; focused ion beam etching machine
Classification Information
Class [009]
Computer & Software Products & Electrical & Scientific Products
Microscope; surface roughness analyzer; electron beam lithography machine; electron probe micro analyzer; ion beam etching machine; plasma etching and deposition machine; indentation tester; focused ion beam etching machine
First Use Date in General
04th Mar 1975
First Use Date in Commerce
22nd May 2003
Mark Details
Serial Number
No 78699264
Mark Type
No Service/Collective Mark
Attorney Docket Number
No TM05-095
44D Filed
No
44D Current
No
44E filed
No
44E Current
No
66A Filed
No
66A Current
No
Current Basis
No
No Basis
No
Legal History
| Status Date | Action Taken |
|---|---|
| 19th Mar 2018 | REGISTERED AND RENEWED (FIRST RENEWAL - 10 YRS) |
| 19th Mar 2018 | NOTICE OF ACCEPTANCE OF SEC. 8 & 9 - E-MAILED |
| 19th Mar 2018 | REGISTERED - SEC. 8 (10-YR) ACCEPTED/SEC. 9 GRANTED |
| 18th Mar 2018 | CASE ASSIGNED TO POST REGISTRATION PARALEGAL |
| 06th Mar 2018 | TEAS SECTION 8 & 9 RECEIVED |
| 17th Oct 2013 | NOTICE OF ACCEPTANCE OF SEC. 8 & 15 - MAILED |
| 17th Oct 2013 | REGISTERED - SEC. 8 (6-YR) ACCEPTED & SEC. 15 ACK. |
| 16th Oct 2013 | CASE ASSIGNED TO POST REGISTRATION PARALEGAL |
| 08th Oct 2013 | TEAS SECTION 8 & 15 RECEIVED |
| 08th Oct 2013 | REGISTERED - SEC. 8 (6-YR) & SEC. 15 FILED |