About 18 Trademarks found that are filed by the attorney Ernestine C Bartlett

ELECTRIC SHAVERS, RAZORS

DATA PROCESSORS AND PARTS THEREFOR; DEVICES FOR DATA ADMINISTRATION, NAMELY, COMPUTERS; COMPUTER PERIPHERALS AND PARTS THEREFOR; SEMICONDUCTORS; COMPUTER CHIPS AND COMPUTER SOFTWARE, ALL THE AFORESAID GOODS FOR USE IN AUTOMOTIVE SAFETY SYSTEMS

APPARATUS AND INSTRUMENTS FOR RECORDING, TRANSMITTING OR REPRODUCING SOUND AND/OR IMAGES, NAMELY, LIQUID CRYSTAL DISPLAY (LCD) PROJECTORS, LIGHT EMITTING DIODE (LED) PROJECTORS, SLIDE PROJECTORS, TELEVISION SETS, OPERATING SOFTWARE FOR THE AFOREMENTIONED PRODUCTS

Spectrometers

Laser ellipsometry metrology apparatus, namely, laser ellipsometers and laser reflectometers used in silicon and the compound semiconductor industry, x-ray fluorescence analyzers and testers for discs and wafers

METROLOGY TOOL, NAMELY, LASERS FOR IN-LINE PROCESS CONTROL OF ULTRA-THIN GATE OXIDES, FOR IN-LINE PROCESS CONTROL IN INTEGRATED CIRCUIT PRODUCTION, AND FOR OPTICAL MEASUREMENT IN PATTERNED SEMICONDUCTOR WAFERS

electric, electronic and electroacoustic apparatus for receiving, recording, reproducing, transmitting, and processing sound signals and voices, namely, dictating machines, speech recognition machines, speech processing machines, voice-controlled selection, dial, and search machines; computer software for use in speech recognition, speech processing, voice-controlled selection, dial, and search machines

Video projectors and projection televisions; projectors, namely slide, photographic and movie projectors; parts and fittings to the aforesaid goods

Semiconductors, integrated circuits, semiconductor and silicon chips, laser diodes, zener diodes, light emitting diodes, surge protective diodes, transistors

Analytical apparatus, namely, metrology tool for in-line process control of ultra-thin gate oxides, for in-line process control in integrated circuit production, and for optical measurement in patterned wafers