About 1 Trademarks found for “windowSEM”

Electron microscope; Electron microscope that can obtain images of sample located at atmospheric pressure or low vacuum; Thin membrane used for an electron microscope to separate an inner vacuum space of the electron microscope from an outer atmosphere space in which a sample is placed; Electron microscope parts; Device for Energy Dispersive X-ray Spectroscopy (EDS device); Cross sectional polisher (ion miller) using ion beam for polishing a cross section of, for example, a specimen used for an electron microscope; Particle analysis device using an electron microscope and an EDS device; Computer central processing units for processing information, data, sound or images for use with electron microscopes, particle analysis devices or cross sectional polisher (ion miller) using ion beam; Computer operating programs, recorded, for use with electron microscopes, particle analysis devices or cross sectional polisher (ion miller) using ion beam; Computer software for artificial intelligence, for use with electron microscopes, particle analysis devices or cross sectional polisher (ion miller) using ion beam.