Semiconductors; silicon wafers; packaged oscillators; integrated circuits; electronic devices for measuring, testing and generating electronic and electrical timing or clock signals in silicon semiconductor chips and signal conditioning circuitry, namely, electromechanical oscillators.
Semiconductors; silicon wafers; packaged oscillators; integrated circuits; electronic devices for measuring, testing and generating electronic and electrical timing or clock signals in silicon semiconductor chips and signal conditioning circuitry, namely, electromechanical oscillators.
