Testing apparatus, namely, testing equipment for detecting manufacturing defects and design flaws in electronics and electromechanical devices; testing apparatus, namely, Highly Accelerated Stress Screen (HASS) and Highly Accelerated Stress Audit (HASA) testing equipment which subjects a product to a series of overstresses for detecting manufacturing defects and design flaws in electronic and electromechanical assemblies; Highly Accelerated Life Testing (HALT) equipment, namely, stress screening chamber and control apparatus to impart thermal and electrical stimuli to a product or device located in the stress screening chamber, and to a table that can be used independently or in conjunction with the stress screening chamber to impart vibrational and electrical stimuli to a device or product.
Testing apparatus, namely, testing equipment for detecting manufacturing defects and design flaws in electronics and electromechanical devices; testing apparatus, namely, Highly Accelerated Stress Screen (HASS) and Highly Accelerated Stress Audit (HASA) testing equipment which subjects a product to a series of overstresses for detecting manufacturing defects and design flaws in electronic and electromechanical assemblies; Highly Accelerated Life Testing (HALT) equipment, namely, stress screening chamber and control apparatus to impart thermal and electrical stimuli to a product or device located in the stress screening chamber, and to a table that can be used independently or in conjunction with the stress screening chamber to impart vibrational and electrical stimuli to a device or product.
Testing apparatus, namely, testing equipment for detecting manufacturi...
