Apparatus, instruments and software for scanning probe microscopy; microscopes; apparatus, devices and software for surface scanning, capture, measurement and analysis of 3D and nanoscale structures, and 3D and conductive measurements of sub-nanometer surface features; parts and fittings for the aforesaid apparatus, instruments and devices.
Scanning probe microscopy services; science and technology services, namely, surface scanning, capture and measurement of 3D and nanoscale structures, and 3D and conductive measurements of sub-nanometer surface features; software services and data analysis, and consultation in relation to the aforesaid.
Apparatus, instruments and software for scanning probe microscopy; microscopes; apparatus, devices and software for surface scanning, capture, measurement and analysis of 3D and nanoscale structures, and 3D and conductive measurements of sub-nanometer surface features; parts and fittings for the aforesaid apparatus, instruments and devices.
Scanning probe microscopy services; science and technology services, namely, surface scanning, capture and measurement of 3D and nanoscale structures, and 3D and conductive measurements of sub-nanometer surface features; software services and data analysis, and consultation in relation to the aforesaid.
Scanning probe microscopy services; science and technology services, n...
