Layer thickness-measuring apparatus; tactile layer measuring apparatus; non-destructive layer measuring apparatus; layer measuring apparatus using magnet-inductive and eddy current processes; layer measuring apparatus using magnet-inductive or eddy current processes; probes for the aforesaid layer measuring apparatus.
FORMALIZED
on 27 Jun 2024
MP0
HELMUT FISCHER GMBH INSTITUT FÜRELEKTRONIK UND MESSTECHNIK
Layer thickness-measuring apparatus; tactile layer measuring apparatus; non-destructive layer measuring apparatus; layer measuring apparatus using magnet-inductive and eddy current processes; layer measuring apparatus using magnet-inductive or eddy current processes; probes for the aforesaid layer measuring apparatus.
