About 2 Trademarks found for “ADVANTEST”

Memory test system (RAM, HMOS-RAM, ECL-RAM, ROM, semiconductor memory devices test), VLSI test system (VLSI device test), LSI test system (microprocessor, digital watch, RAM, ROM, LSI devices test), test data management system (program data, analysis data, LSI test data), components test system (tester), analog and digital LSI devices test system, circuit test system, semiconductor image devices test system, logic analyzers, tester console, signal generators, spectrum analyzers, equipment for measuring the strength of electro-magnetic field, digital spectrum analyzers (FFT analyzers), electronics counters, digital voltage/current/resistance/meter, DC voltage/current generators, multi-channel digital thermometers, logic analyzers, scanner, multiplexer.

Machines to test semiconductors, machines to test system large scale integrated circuits, machines to test large scale integrated circuits and machines to test the memory of semiconductors, system large scale integrated circuits and large scale integrated circuits; pre-recorded electronic circuits, magnetic discs, magnetic tapes and electronic storage device in the nature of memory media, featuring programs for semiconductor testing machines and their peripherals; computer software for testing semiconductors; computer software for operating machines to test semiconductors; electronic machines and apparatus, namely, computers, semiconductor and integrated circuit test information management machines, validating machines for circuits designing of semiconductor; machines to analyse terahertz spectroscopy, semiconductor wafers and chips and electron microscopes; electric and magnetic meters and testers, namely, spectrum analyzers, network analyzers.