About 6 Trademarks found that are owned by Jordan Valley Semiconductors Limited

Scientific, measuring and analytical apparatus for materials characterization, namely, x-rays, x-ray tubes, x-ray cameras, diffractometers, reflectometers, refractometers, x-ray typography apparatus and instruments, x-ray scattering apparatus and instruments, and spectroscopes for scientific use; x-ray metrology apparatus for semi-conductors and materials, namely, thin films, metallic thin films, multi-layers, ceramics, superconductors; apparatus and instruments for analyzing and testing thin films, metallic thin films, multi-layers, ceramics, superconductors, and semi-conductor materials; x-ray apparatus and instruments for scientific use; x-ray tubes for scientific use; x-ray cameras for scientific use; x-ray detectors for scientific use; diffractometers; reflectometers; x-ray topography apparatus and instruments; surface Brillouin scattering and surface Brillouin spectroscopy apparatus and instruments; powder, single crystal and high resolution diffraction measuring apparatus and instruments; computer hardware and computer software adapted for use with all the aforementioned goods sold as a unit; parts and fittings for all the aforementioned goods

MEASURING AND ANALYTICAL APPARATUS AND INSTRUMENTS AND MATERIALS CHARACTERIZATION AND MATERIALS TESTING APPARATUS AND INSTRUMENTS, NAMELY, APPARATUS AND INSTRUMENTS FOR ANALYZING AND TESTING THIN FILMS, METALLIC THIN FILMS, MULTI LAYERS, CERAMICS, SUPER CONDUCTORS AND SEMI-CONDUCTORS; POWDER, SINGLE CRYSTAL AND HIGH RESOLUTION DIFFRACTION MEASURING TOOLS; X-RAY APPARATUS AND INSTRUMENTS, NAMELY, X-RAY TUBES, X-RAY CAMERAS, X-RAY DETECTORS, DIFFRACTOMETERS, REFLECTOMETERS, AND X-RAY TOPOGRAPHY APPARATUS AND INSTRUMENTS FOR USE IN THE FIELD OF MATERIALS CHARACTERIZATION AND MATERIALS TESTING; COMPUTER HARDWARE ADAPTED FOR USE WITH THE AFORESAID; COMPUTER OPERATING SYSTEM SOFTWARE ADAPTED FOR USE WITH THE AFORESAID

CONSULTING SERVICES IN NON-MEDICAL X-RAY TECHNOLOGY

NON-MEDICAL X-RAY GENERATING TUBES; NON-MEDICAL X-RAY DETECTORS; NON-MEDICAL X-RAY FOCUSING DEVICES, NAMELY X-RAY MIRRORS, X-RAY CAPILLARIES AND X-RAY OPTICS

ANALYTICAL X-RAY DIFFRACTOMETERS FOR MANUFACTURING AND MATERIALS RESEARCH AND DEVELOPMENT; COMPUTER SOFTWARE FOR THE ACQUISITION AND ANALYSIS OF X-RAY SCATTERING DATA OBTAINED FROM X-RAY DIFFRACTOMETERS; HIGH-BRIGHTNESS X-RAY GENERATORS; AND ASSOCIATED ELECTRICAL POWER SUPPLIES

X-RAY DIFFRACTOMETER; WAFER MAPPING APPARATUS, NAMELY, APPARATUS TO DETERMINE THE COMPOSITION AND THICKNESS OF EPITAXIAL LAYERS

X-RAY DIFFRACTOMETER; WAFER MAPPING APPARATUS, NAMELY, APPARATUS TO DETERMINE THE COMPOSITION AND THICKNESS OF EPITAXIAL LAYERS