| DMPI Dominion MicroProbes, Inc.
86312838 18 Jun 2014 | on 12 Jan 2022
| Electronic testing equipment, namely, apparatus for testing semiconduc... Class 009 Class 009 Computer & Software Products & Electrical & Scientific Products Electronic testing equipment, namely, apparatus for testing semiconductor and micro-electronic devices and circuits; Electronic testing equipment, namely, probe stations for mounting probes and their components and accessories, namely, manual positioners, automated positioners and environmental chambers, all for testing integrated circuits and semiconductors; Probes for testing integrated circuits; Millimeter and sub-millimeter wavelength on-wafer ground-signal-ground probes and associated components for electrical measurement of devices and materials, namely, integrated circuits, semiconductors, mircoelectromechanical devices, organic devices, and magnetic spin-torque devices; Probes and probe stations for mounting probes, and their components and accessories, namely, manual positioners, automated positioners and environmental chambers, all for on-wafer testing of integrated circuits | | | DOMINION MICROPROBES Dominion MicroProbes, Inc.
86312847 18 Jun 2014 | on 30 Sep 2022 | Electronic testing equipment, namely, apparatus for testing semiconduc... Class 009 Class 009 Computer & Software Products & Electrical & Scientific Products Electronic testing equipment, namely, apparatus for testing semiconductor and micro-electronic devices and circuits; Electronic testing equipment, namely, probe stations for mounting probes and their components and accessories, namely, manual positioners, automated positioners and environmental chambers, all for testing integrated circuits and semiconductors; Probes for testing integrated circuits; Millimeter and sub-millimeter wavelength on-wafer ground-signal-ground probes, and associated components, for electrical measurement of integrated circuits and semiconductors; Probes and probe station for mounting probes, and their components and accessories namely, manual positioners, automated positioners and environmental chambers, all for on-wafer testing of integrated circuits | |