probe arrays and electrical contact pins for testing integrated circuit chips; integrated circuit electrical testers; electric test housings and test Read More

Classification Information

Class [009]
Probe arrays and electrical contact pins for testing integrated circuit chips; integrated circuit electrical testers; electric test housings and test sockets and components thereof for integrated circuits

Classification kind code

Mark Details

Serial Number

1837624

Mark Type

Trademark

Legal History

Action Taken	Status
Submitted for opposition 50 on 18^th Jan 2019	Allowed
Submitted for opposition 51 on 18^th Jan 2019	Allowance Notice Sent
Submitted for opposition 42 on 03^rd Oct 2018	Advertised
Submitted for opposition 26 on 27^th Sep 2018	Approved
Submitted for opposition 27 on 09^th Aug 2018	Approval Notice Sent
Submitted for opposition 22 on 30^th Apr 2018	Search Recorded
Submitted for opposition 20 on 30^th Apr 2018	Examiner's First Report
Submitted for opposition 31 on 17^th May 2017	Formalized
Submitted for opposition 30 on 15^th May 2017	Filed
Submitted for opposition 1 on 15^th May 2017	Created

MMRF

Classification Information

Class [009]Probe arrays and electrical contact pins for testing integrated circuit chips; integrated circuit electrical testers; electric test housings and test sockets and components thereof for integrated circuits

Classification kind code

Mark Details

Serial Number

Mark Type

Legal History

Class [009]
Probe arrays and electrical contact pins for testing integrated circuit chips; integrated circuit electrical testers; electric test housings and test sockets and components thereof for integrated circuits