on 19 Mar 2014
Last Applicant/ Owned by
KABUSHIKI KAISHA TOPCON
75-1, Hasunuma-choItabashi-kuTokyo 174-8580
JP
Serial Number
1516784 filed on 25th Feb 2011
Correspondent Address
World Exchange Plaza100 Queen Street, Suite 1300Ottawa
ONTARIO
CA
K1P1J9
Trademark usage description
microscopes for analyzing and inspecting semiconductor wafers; scanning electron microscopes; optical microscopes; microscopes; interferometers; laser Read MoreCIPO Classification Code
Nice
1516784
Trademark
Action Taken | Status |
---|---|
Submitted for opposition 7 on 19th Mar 2014 | Abandoned - Subsection 40(3) |
Submitted for opposition 51 on 30th Nov 2012 | Allowance Notice Sent |
Submitted for opposition 50 on 30th Nov 2012 | Allowed |
Submitted for opposition 42 on 15th Aug 2012 | Advertised |
Submitted for opposition 26 on 26th Jul 2012 | Approved |
Submitted for opposition 27 on 07th Jun 2012 | Approval Notice Sent |
Submitted for opposition 20 on 28th Jul 2011 | Examiner's First Report |
Submitted for opposition 22 on 28th Jul 2011 | Search Recorded |
Submitted for opposition 31 on 01st Mar 2011 | Formalized |
Submitted for opposition 1 on 25th Feb 2011 | Created |